Recently added

Simulation of polychromatic effects in high NA EUV lithography

Erdmann, Andreas; Mesilhy, Hazem; Evanschitzky, Peter; Saadeh, Qais; Soltwisch, Victor; Bihr, Simon; Zimmermann, Joerg; Philipsen, Vicky (2021)

Infrared Colloidal Quantum Dot Image Sensors

Pejovic, Vladimir; Georgitzikis, Epimitheas; Lee, Jiwon; Lieberman, Itai; Cheyns, David; Heremans, Paul; Malinowski, Pawel (2022)

TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs

Vasilev, Alexander; Jech, Markus; Grill, Alexander; Rzepa, Gerhard; Schleich, Christian; Tyaginov, Stanislav; Makarov, Alexander; Pobegen, Gregor; Grasser, Tibor; Waltl, Michael (2022-04-19)

Extreme contact shrink for back end of line connectivity

Schleicher, Filip; Paolillo, Sara; Decoster, Stefan; Wu, Chen; Vega Gonzalez, Victor; Hasan, Mahmudul; Beral, Christophe; Lazzarino, Frederic (2022-05-10)

Pupil optimization for after etch defectivity: what imaging metrics matter?

Frommhold, Andreas; Franke, Joern-Holger; Maslow, Mark J.; Nafus, Kathleen; Rispens, Gijsbert (2021)

On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices

Putcha, Vamsi; Cheng, Liang; Alian, AliReza; Zhao, Ming; Lu, H.; Parvais, Bertrand; Waldron, Niamh; Linten, Dimitri; Collaert, Nadine (2021)

Quarter-filled Kane-Mele Hubbard model: Dirac half metals

Mellaerts, S.; Meng, R.; Afanasiev, V; Seo, J. W.; Locquet, J-P; Houssa, Michel (2021)

Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology

Artola, L.; Nuns, T.; Cussac, G.; Chiarella, Thomas; Mitard, Jerome (2021)

Surface Chemistry and Nanoscale Wet Etching of Group IV Semiconductors in Acidic H2O2 Solutions

lebedev, Mikhail; Mayer, Thomas; van Dorp, Dennis; Abrenica, Graniel; Arnauts, Sophia; Altamirano Sanchez, Efrain; De Gendt, Stefan (2021-02)

Bayesian inverse reinforcement learning for strategy extraction in the iterated prisoner's dilemma game

Cami, M.; Terrucha, Ines; Khaluf, Yara; Simoens, Pieter (2021)

Implementation-free forensic watermarking for adaptive streaming with A/B watermarking

Mareen, Hannes; Van Wallendael, Glenn; Lambert, Peter (2022)

Electro-optic co-design for next generation silicon optical transmitters

Breyne, Laurens; Lambrecht, Joris; Vanhoecke, Michael; Ossieur, Peter; Roelkens, Gunther; Bauwelinck, Johan; Yin, Xin (2021)

Comparison of two novel integral equation approaches for lossy conductor modeling

Huynen, Martijn; Gossye, Michiel; De Zutter, Daniel; Rogier, Hendrik; Vande Ginste, Dries (2021)

Towards a personal data vault society: an interplay between technological and business perspectives

Van der Wee, M.; Verbrugge, Sofie; Vannieuwenborg, Frederic; Colle, Didier; Taelman, Ruben; Verborgh, Ruben (2021)

On the SNOW Stream Ciphers

Kraleva, L; Li, C (2021)

Selectivity Enhancement for Ruthenium Atomic Layer Deposition in Sub-50 nm Nanopatterns by Diffusion and Size-Dependent Reactivity

Grillo, Fabio; Van Ommen, Ruud; Clerix, Jan-Willem; Marques, Esteban; Soethoudt, Job; Pourtois, Geoffrey; Delabie, Annelies (2021-08-11)

imec Publications: Recent submissions

Simulation of polychromatic effects in high NA EUV lithography

Infrared Colloidal Quantum Dot Image Sensors

TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs

Extreme contact shrink for back end of line connectivity

Pupil optimization for after etch defectivity: what imaging metrics matter?

On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices

Quarter-filled Kane-Mele Hubbard model: Dirac half metals

Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology

Surface Chemistry and Nanoscale Wet Etching of Group IV Semiconductors in Acidic H2O2 Solutions

Bayesian inverse reinforcement learning for strategy extraction in the iterated prisoner's dilemma game

Implementation-free forensic watermarking for adaptive streaming with A/B watermarking

Electro-optic co-design for next generation silicon optical transmitters

Comparison of two novel integral equation approaches for lossy conductor modeling

Towards a personal data vault society: an interplay between technological and business perspectives

On the SNOW Stream Ciphers

Selectivity Enhancement for Ruthenium Atomic Layer Deposition in Sub-50 nm Nanopatterns by Diffusion and Size-Dependent Reactivity

Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality

Transient pull-in simulation of electrostatic microvalve with physics-based contact function

NXE:3400 OPC Process Monitoring: Model Validity vs. Process Variability

EUV Single Patterning Exploration for Pitch 28 nm

imec Publications: Recent submissions

Simulation of polychromatic effects in high NA EUV lithography ﻿

Infrared Colloidal Quantum Dot Image Sensors ﻿

TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs ﻿

Extreme contact shrink for back end of line connectivity ﻿

Pupil optimization for after etch defectivity: what imaging metrics matter? ﻿

On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices ﻿

Quarter-filled Kane-Mele Hubbard model: Dirac half metals ﻿

Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology ﻿

Surface Chemistry and Nanoscale Wet Etching of Group IV Semiconductors in Acidic H2O2 Solutions ﻿

Bayesian inverse reinforcement learning for strategy extraction in the iterated prisoner's dilemma game ﻿

Implementation-free forensic watermarking for adaptive streaming with A/B watermarking ﻿

Electro-optic co-design for next generation silicon optical transmitters ﻿

Comparison of two novel integral equation approaches for lossy conductor modeling ﻿

Towards a personal data vault society: an interplay between technological and business perspectives ﻿

On the SNOW Stream Ciphers ﻿

Selectivity Enhancement for Ruthenium Atomic Layer Deposition in Sub-50 nm Nanopatterns by Diffusion and Size-Dependent Reactivity ﻿

Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality ﻿

Transient pull-in simulation of electrostatic microvalve with physics-based contact function ﻿

NXE:3400 OPC Process Monitoring: Model Validity vs. Process Variability ﻿

EUV Single Patterning Exploration for Pitch 28 nm ﻿

Simulation of polychromatic effects in high NA EUV lithography

Infrared Colloidal Quantum Dot Image Sensors

TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs

Extreme contact shrink for back end of line connectivity

Pupil optimization for after etch defectivity: what imaging metrics matter?

On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices

Quarter-filled Kane-Mele Hubbard model: Dirac half metals

Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology

Surface Chemistry and Nanoscale Wet Etching of Group IV Semiconductors in Acidic H2O2 Solutions

Bayesian inverse reinforcement learning for strategy extraction in the iterated prisoner's dilemma game

Implementation-free forensic watermarking for adaptive streaming with A/B watermarking

Electro-optic co-design for next generation silicon optical transmitters

Comparison of two novel integral equation approaches for lossy conductor modeling

Towards a personal data vault society: an interplay between technological and business perspectives

On the SNOW Stream Ciphers

Selectivity Enhancement for Ruthenium Atomic Layer Deposition in Sub-50 nm Nanopatterns by Diffusion and Size-Dependent Reactivity

Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality

Transient pull-in simulation of electrostatic microvalve with physics-based contact function

NXE:3400 OPC Process Monitoring: Model Validity vs. Process Variability

EUV Single Patterning Exploration for Pitch 28 nm