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Does NIST database provide reliable effective attenuation lenght for XPS analysis

dc.contributor.authorNakajima, K.
dc.contributor.authorKimura, Kenji
dc.contributor.authorConard, Thierry
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-16T18:07:01Z
dc.date.available2021-10-16T18:07:01Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12608
dc.sourceIIOimport
dc.titleDoes NIST database provide reliable effective attenuation lenght for XPS analysis
dc.typeOral presentation
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.source.peerreviewno
dc.source.conference6th International Symposium on Atomic Level Characterizations - ALC
dc.source.conferencedate29/10/2007
dc.source.conferencelocationKanazawa Japan
imec.availabilityPublished - imec


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