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Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design

dc.contributor.authorPapanikolaou, Antonis
dc.date.accessioned2021-10-16T18:27:22Z
dc.date.available2021-10-16T18:27:22Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12671
dc.sourceIIOimport
dc.titleReliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
dc.typeOral presentation
dc.source.peerreviewno
dc.source.conferenceMEDEA+ Design Automation Conference
dc.source.conferencedate21/05/2007
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


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