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Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-raman and other measurements

dc.contributor.authorJain, Suresh
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T14:35:26Z
dc.date.available2021-09-29T14:35:26Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1271
dc.sourceIIOimport
dc.titleStresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-raman and other measurements
dc.typeOral presentation
dc.source.peerreviewno
dc.source.conferenceMaterials Research Society Spring Meeting. Symposium F on GeSi and Related Compounds; April 9-11, 1996; San Francisco, Calif., U
dc.source.conferencelocation
imec.availabilityPublished - imec


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