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Measurement and simulation of statistical variability in FinFETs

dc.contributor.authorMercha, Abdelkarim
dc.date.accessioned2021-10-17T08:57:19Z
dc.date.available2021-10-17T08:57:19Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14150
dc.sourceIIOimport
dc.titleMeasurement and simulation of statistical variability in FinFETs
dc.typeOral presentation
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.source.peerreviewno
dc.source.conferenceESSDERC/ESSIRC Workshop on CMOS Variability Research in Europe
dc.source.conferencedate19/09/2008
dc.source.conferencelocationEdinburgh Scotland
imec.availabilityPublished - imec


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