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Device scaling beyond 22nm

dc.contributor.authorHoffmann, Thomas Y.
dc.date.accessioned2021-10-19T14:20:31Z
dc.date.available2021-10-19T14:20:31Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19081
dc.sourceIIOimport
dc.titleDevice scaling beyond 22nm
dc.typeOral presentation
dc.source.peerreviewno
dc.source.conferenceIMEC Taiwan Seminar
dc.source.conferencedate15/03/2011
dc.source.conferencelocationHsinchu Taiwan
imec.availabilityPublished - imec


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