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Reliability study of power gallium nitride based transistors

dc.contributor.authorMarcon, Denis
dc.date.accessioned2021-10-19T16:01:00Z
dc.date.available2021-10-19T16:01:00Z
dc.date.issued2011-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19379
dc.sourceIIOimport
dc.titleReliability study of power gallium nitride based transistors
dc.typePHD thesis
dc.contributor.imecauthorMarcon, Denis
dc.source.peerreviewno
dc.contributor.thesisadvisorMertens, Robert
dc.contributor.thesisadvisorBorghs, Gustaaf
imec.availabilityPublished - imec


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