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Microelectronics reliability:"Live and let die..."

dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-10-20T10:35:53Z
dc.date.available2021-10-20T10:35:53Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20568
dc.sourceIIOimport
dc.titleMicroelectronics reliability:"Live and let die..."
dc.typeOral presentation
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewno
dc.source.conferenceMTM Department Seminar
dc.source.conferencedate9/02/2012
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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