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Calibration of PIXE yields using binary thin films on Si

dc.contributor.authorMeersschaut, Johan
dc.contributor.authorCarbonel, Jacob
dc.contributor.authorLenka, Hara
dc.contributor.authorZhao, Qiang
dc.contributor.authorVantomme, Andre
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-21T10:00:25Z
dc.date.available2021-10-21T10:00:25Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22795
dc.sourceIIOimport
dc.titleCalibration of PIXE yields using binary thin films on Si
dc.typeOral presentation
dc.contributor.imecauthorMeersschaut, Johan
dc.contributor.imecauthorVantomme, Andre
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecMeersschaut, Johan::0000-0003-2467-1784
dc.source.peerreviewno
dc.source.conference11th European Conference on Accelerators in Applied Research and Technology - ECAART
dc.source.conferencedate8/09/2013
dc.source.conferencelocationNamur Belgium
imec.availabilityPublished - imec
imec.internalnotesProceedings will be published by Elsevier Science Publishers in a special issue of Nuclear Instruments and Methods in Physics Research, section B


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