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Reliability in nanometer CMOS

dc.contributor.authorRaghavan, Praveen
dc.date.accessioned2021-10-21T11:14:46Z
dc.date.available2021-10-21T11:14:46Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22975
dc.sourceIIOimport
dc.titleReliability in nanometer CMOS
dc.typeOral presentation
dc.source.peerreviewno
dc.source.conferenceIEEE International Solid-State Circuits Conference - ISSCC
dc.source.conferencedate9/02/2013
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec
imec.internalnotesForum: F6: Mixed-Signal/RF Design and Modeling in Next-Generation CMOS


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