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Suppression of twin defects in single crystalline GeSn compounds on silicon by solid phase crystallization

dc.contributor.authorLieten, Ruben
dc.contributor.authorSeo, Jin Won
dc.contributor.authorJevasuwan, Wipakorn
dc.contributor.authorHattori, Hirayuki
dc.contributor.authorUchida, Noriyuki
dc.contributor.authorMiura, Shu
dc.contributor.authorTanaka, Masatoshi
dc.contributor.authorLocquet, Jean-Pierre
dc.contributor.authorMaeda, Tatsuro
dc.date.accessioned2021-10-22T03:06:49Z
dc.date.available2021-10-22T03:06:49Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24142
dc.sourceIIOimport
dc.titleSuppression of twin defects in single crystalline GeSn compounds on silicon by solid phase crystallization
dc.typeOral presentation
dc.contributor.imecauthorLieten, Ruben
dc.source.peerreviewno
dc.source.conferenceMRS Spring Meeting Symposium A: Film-Silicon Science and Technology
dc.source.conferencedate21/04/2014
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec


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