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Potential-induced degradation (PID): A test campaign at module level

dc.contributor.authorCarolus, Jorne
dc.contributor.authorDaenen, Michaël
dc.date.accessioned2021-10-23T10:11:48Z
dc.date.available2021-10-23T10:11:48Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26393
dc.sourceIIOimport
dc.titlePotential-induced degradation (PID): A test campaign at module level
dc.typeOral presentation
dc.contributor.imecauthorCarolus, Jorne
dc.contributor.imecauthorDaenen, Michaël
dc.source.peerreviewno
dc.source.conferenceSunday 2016
dc.source.conferencedate23/11/2016
dc.source.conferencelocationVelthoven Nederland
imec.availabilityPublished - imec


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