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The mechanisms of hot carrier degradation and oxide breakdown in submicron CMOS techmologies

dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-06T11:13:58Z
dc.date.available2021-10-06T11:13:58Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3474
dc.sourceIIOimport
dc.titleThe mechanisms of hot carrier degradation and oxide breakdown in submicron CMOS techmologies
dc.typeOral presentation
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewno
dc.source.conference7th International Symposium on the Physical and Failure Analysis of Integrated Circuits; July 1999; Singapore.
imec.availabilityPublished - imec


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