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Investigation of electrical properties of leading-edge sealed CBRAM devices using novel materials for future memory technologies

dc.contributor.authorRadhakrishnan, Janaki
dc.date.accessioned2021-10-29T02:34:38Z
dc.date.available2021-10-29T02:34:38Z
dc.date.issued2020-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35783
dc.sourceIIOimport
dc.titleInvestigation of electrical properties of leading-edge sealed CBRAM devices using novel materials for future memory technologies
dc.typePHD thesis
dc.contributor.imecauthorRadhakrishnan, Janaki
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.contributor.thesisadvisorHoussa, Michel
dc.contributor.thesisadvisorGoux, Ludovic
imec.availabilityPublished - open access


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