Analysis of dark current in Ge-on-Si photodiodes at cryogenic temperatures

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dc.contributor.author	Pizzone, Andrea
dc.contributor.author	Srinivasan, Srinivasan Ashwyn
dc.contributor.author	Verheyen, Peter
dc.contributor.author	Lepage, Guy
dc.contributor.author	Balakrishnan, Sadhishkumar
dc.contributor.author	Van Campenhout, Joris
dc.date.accessioned	2021-11-02T16:05:48Z
dc.date.available	2021-11-02T16:05:48Z
dc.date.issued	2020
dc.identifier.issn	2374-0140
dc.identifier.other	WOS:000612237500151
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/38233
dc.source	WOS
dc.title	Analysis of dark current in Ge-on-Si photodiodes at cryogenic temperatures
dc.type	Proceedings paper
dc.contributor.imecauthor	Pizzone, Andrea
dc.contributor.imecauthor	Srinivasan, Srinivasan Ashwyn
dc.contributor.imecauthor	Verheyen, Peter
dc.contributor.imecauthor	Lepage, Guy
dc.contributor.imecauthor	Balakrishnan, Sadhishkumar
dc.contributor.imecauthor	Van Campenhout, Joris
dc.contributor.orcidimec	Verheyen, Peter::0000-0002-8245-9442
dc.contributor.orcidimec	Van Campenhout, Joris::0000-0003-0778-2669
dc.identifier.eisbn	978-1-7281-5891-4
dc.source.numberofpages	2
dc.source.peerreview	yes
dc.source.conference	IEEE Photonics Conference (IPC)
dc.source.conferencedate	SEP 28-OCT 01, 2020
imec.availability	Under review

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Version	Item	Date	Summary
2	20.500.12860/38233.2	2022-01-06T10:58:56Z	validation by library/open access desk
1	20.500.12860/38233*	2021-11-02T16:05:48Z