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A multi-energy level agnostic approach for defect generation during TDDB stress
| dc.contributor.author | Vici, Andrea | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Van Beek, Simon | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.date.accessioned | 2022-06-24T13:19:39Z | |
| dc.date.available | 2022-05-27T02:22:57Z | |
| dc.date.available | 2022-06-24T13:19:39Z | |
| dc.date.issued | 2022 | |
| dc.identifier.issn | 0038-1101 | |
| dc.identifier.other | WOS:000796002800004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39898.2 | |
| dc.source | WOS | |
| dc.title | A multi-energy level agnostic approach for defect generation during TDDB stress | |
| dc.type | Journal article | |
| dc.contributor.imecauthor | Vici, Andrea | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Van Beek, Simon | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Van Beek, Simon::0000-0002-2499-4172 | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.identifier.doi | 10.1016/j.sse.2022.108298 | |
| dc.source.numberofpages | 8 | |
| dc.source.peerreview | yes | |
| dc.source.journal | SOLID-STATE ELECTRONICS | |
| dc.source.issue | Special issue: Papers from INFOS 2021 | |
| dc.source.volume | 193 | |
| imec.availability | Under review |
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