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dc.contributor.authorGarbuglia, Federico
dc.contributor.authorClaeys, Tim
dc.contributor.authorCouckuyt, Ivo
dc.contributor.authorDeschrijver, Dirk
dc.contributor.authorDhaene, Tom
dc.date.accessioned2022-06-03T02:21:06Z
dc.date.available2022-06-03T02:21:06Z
dc.date.issued2022-MAY 18
dc.identifier.issn0018-9375
dc.identifier.otherWOS:000799600400001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39921
dc.sourceWOS
dc.titleBayesian Active Learning for Radiation Pattern Sampling Over Cylindrical Surfaces
dc.typeJournal article
dc.typeJournal article (pre-print)
dc.contributor.imecauthorGarbuglia, Federico
dc.contributor.imecauthorCouckuyt, Ivo
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.imecauthorDhaene, Tom
dc.contributor.orcidimecGarbuglia, Federico::0000-0002-1917-1921
dc.contributor.orcidimecCouckuyt, Ivo::0000-0002-9524-4205
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.identifier.doi10.1109/TEMC.2022.3172483
dc.source.numberofpages8
dc.source.peerreviewyes
dc.source.journalIEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
imec.availabilityUnder review


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