Recently added

Simulation of polychromatic effects in high NA EUV lithography

Erdmann, Andreas; Mesilhy, Hazem; Evanschitzky, Peter; Saadeh, Qais; Soltwisch, Victor; Bihr, Simon; Zimmermann, Joerg; Philipsen, Vicky (2021)

Pupil optimization for after etch defectivity: what imaging metrics matter?

Frommhold, Andreas; Franke, Joern-Holger; Maslow, Mark J.; Nafus, Kathleen; Rispens, Gijsbert (2021)

On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices

Putcha, Vamsi; Cheng, Liang; Alian, AliReza; Zhao, Ming; Lu, H.; Parvais, Bertrand; Waldron, Niamh; Linten, Dimitri; Collaert, Nadine (2021)

Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology

Artola, L.; Nuns, T.; Cussac, G.; Chiarella, Thomas; Mitard, Jerome (2021)

Surface Chemistry and Nanoscale Wet Etching of Group IV Semiconductors in Acidic H2O2 Solutions

lebedev, Mikhail; Mayer, Thomas; van Dorp, Dennis; Abrenica, Graniel; Arnauts, Sophia; Altamirano Sanchez, Efrain; De Gendt, Stefan (2021-02)

Bayesian inverse reinforcement learning for strategy extraction in the iterated prisoner's dilemma game

Cami, M.; Terrucha, Ines; Khaluf, Yara; Simoens, Pieter (2021)

Implementation-free forensic watermarking for adaptive streaming with A/B watermarking

Mareen, Hannes; Van Wallendael, Glenn; Lambert, Peter (2022)

Electro-optic co-design for next generation silicon optical transmitters

Breyne, Laurens; Lambrecht, Joris; Vanhoecke, Michael; Ossieur, Peter; Roelkens, Gunther; Bauwelinck, Johan; Yin, Xin (2021)

Comparison of two novel integral equation approaches for lossy conductor modeling

Huynen, Martijn; Gossye, Michiel; De Zutter, Daniel; Rogier, Hendrik; Vande Ginste, Dries (2021)

Towards a personal data vault society: an interplay between technological and business perspectives

Van der Wee, M.; Verbrugge, Sofie; Vannieuwenborg, Frederic; Colle, Didier; Taelman, Ruben; Verborgh, Ruben (2021)

On the SNOW Stream Ciphers

Kraleva, L; Li, C (2021)

Transient pull-in simulation of electrostatic microvalve with physics-based contact function

Keulemans, Grim; Liang, Boshen; Podkovskiy, Alexey; Jambaldinni, Shruti; Wysocka, Dominika; Zhang, Lei; Stakenborg, Tim; Cheyns, David; Heremans, Paul; Rochus, Veronique (2021-04-26)

NXE:3400 OPC Process Monitoring: Model Validity vs. Process Variability

Xu, Dongbo; Rio, David; Gillijns, Werner; Delorme, Max; Baerts, Christina (2021-02-22)

EUV Single Patterning Exploration for Pitch 28 nm

Xu, Dongbo; Gillijns, Werner; Drissi, Youssef; Tan, Ling Ee; Oak, Apoorva; Kim, Ryan Ryoung han (2021-02-22)

Exploration of Alternative Mask for 0.33NA EUV Single Patterning at Pitch 28nm

Xu, Dongbo; Gillijns, Werner; Tan, Ling Ee; Philipsen, Vicky; Kim, Ryan Ryoung han (2021-10-12)

Design of a low-cost modular 5G RF-EMF exposure sensor

Deprez, Kenneth; Aerts, Sam; Thielens, Arno; Vermeeren, Gunter; Martens, Luc; Joseph, Wout (2021)

Dual-Input Pseudo-CMOS Logic for Digital Applications on Flexible Substrates

Celiker, Hikmet; Dehaene, Wim; Myny, Kris (2021-09-13)

A 4.2mW 4K 6-8GHz CMOS LNA for Superconducting Qubit Readout

Caglar, Alican; Van Winckel, Steven; Brebels, Steven; Wambacq, Piet; Craninckx, Jan (2021)

First results of EUV-scanner compatibility tests performed on novel 'high-NA' reticle absorber materials

Stortelder, Jetske; Ebeling, Robert P.; Rijnsent, Corne; van Putten, Michel; de Rooij-Lohmann, Veronique; Smit, Maximilian; Storm, Arnold J.; Koster, Norbert; Lensen, Henk A.; Philipsen, Vicky; Opsomer, Karl; Thakare, Devesh; Feigl, Torsten; Naujok, Philipp (2021)

Parametric Monte-Carlo Characterization of Si Ring Modulators

Jo, Youngkwan; Ji, Yongjin; Kim, Minkyu; Lischke, Stefan; Mai, Christian; Zimmermann, Lars; Choi, Woo-Young (2021)

Conference contributions: Recent submissions

Simulation of polychromatic effects in high NA EUV lithography ﻿

Pupil optimization for after etch defectivity: what imaging metrics matter? ﻿

On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices ﻿

Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology ﻿

Surface Chemistry and Nanoscale Wet Etching of Group IV Semiconductors in Acidic H2O2 Solutions ﻿

Bayesian inverse reinforcement learning for strategy extraction in the iterated prisoner's dilemma game ﻿

Implementation-free forensic watermarking for adaptive streaming with A/B watermarking ﻿

Electro-optic co-design for next generation silicon optical transmitters ﻿

Comparison of two novel integral equation approaches for lossy conductor modeling ﻿

Towards a personal data vault society: an interplay between technological and business perspectives ﻿

On the SNOW Stream Ciphers ﻿

Transient pull-in simulation of electrostatic microvalve with physics-based contact function ﻿

NXE:3400 OPC Process Monitoring: Model Validity vs. Process Variability ﻿

EUV Single Patterning Exploration for Pitch 28 nm ﻿

Exploration of Alternative Mask for 0.33NA EUV Single Patterning at Pitch 28nm ﻿

Design of a low-cost modular 5G RF-EMF exposure sensor ﻿

Dual-Input Pseudo-CMOS Logic for Digital Applications on Flexible Substrates ﻿

A 4.2mW 4K 6-8GHz CMOS LNA for Superconducting Qubit Readout ﻿

First results of EUV-scanner compatibility tests performed on novel 'high-NA' reticle absorber materials ﻿

Parametric Monte-Carlo Characterization of Si Ring Modulators ﻿