Recently added

Solid-state lithium and Li-ion batteries with silica-gel solid nanocomposite electrolytes

Mees, Maarten; Sagara, A.; Debucquoy, Maarten; Chen, Xubin; Gandrud, Knut Bjarne; Put, Brecht; Arase, H.; Kaneko, Y.; Vereecken, Philippe (2021)

Self-supervised exploration via latent Bayesian surprise

Mazzaglia, Pietro; Catal, Ozan; Verbelen, Tim; Dhoedt, Bart (2021)

A compact 8-bit, 8 GS/s 8xTI SAR ADC in 16 nm with 45 dB SNDR and 5 GHz ERBW

Martens, Ewout; Dermit, Davide; Shrivas, Mithlesh; Nagata, Shun; Craninckx, Jan (2021)

5G-Blueprint: Next Generation Connectivity for Enhanced, Safe, Efficient Transport & Logistics

Marquez-Barja, Johann; Hadiwardoyo, S. Dima; Vandenberghe, Wim; Kenis, Eric; Campodonico, Maria Chiara; dos Santos, Klaudia; Kusumakar, Rakshith; Klepper, Matthijs; Kakes, Geerd; Vandenbossche, Joost (2021)

Design and Manufacturing Technology of Advanced Multi-Die Packages on the 'Slope of Enlightenment': Where Is 3D-Test?

Marinissen, Erik Jan; Stucchi, Michele; Vardaman, E. Jan; Armstrong, Dave; Chen, Harry; Goel, Sandeep Kumar; Huang, Yu; McLaurin, Teresa (2021)

QD-Based Sensors for Infrared Imaging

Malinowski, Pawel; Lee, Jiwon; Georgitzikis, Epimitheas; Pejovic, Vladimir; Lieberman, Itai; Ke, Tung Huei; Li, Yunlong; Verschooten, Tom; Thijs, Steven; Cheyns, David (2021)

Diagnosing and Removing CD-SEM Metrology Artifacts

Mack, Chris; Lorusso, Gian; Delvaux, Christie (2021)

TADF OLED Emission Zone and Stability Analysis with Water Exposure to Different Layers during Deposition

Mac Ciarnain, Rossa; Mo, Hin Wai; Nagayoshi, Kaori; Fujimoto, Hiroshi; Harada, Kentaro; Ke, Tung Huei; Heremans, Paul; Adachi, Chihaya (2021)

GPS-Assisted Feature Matching in Aerial Images with Highly Repetitive Patterns

Luzardo, Gonzalo; Vlaminck, Michiel; Lefkaditis, Dionysios; Philips, Wilfried; Luong, Hiep (2021)

The unavoidable renaissance of electron metrology in the age of High NA EUV

Lorusso, Gian (2021)

VIS-SWIR wideband lens-free imaging

Lin, Ziduo; Yurt, Abdulkadir; Vanmeerbeeck, Geert; Jayapala, Murali; Lee, Jiwon; Kim, Joo Hyoung; Malinowski, Pawel; Lambrechts, Andy (2021)

91.5%-Efficiency fully integrated voltage regulator with 86fF/μm2-high-density 2.5 MIM capacitor

Lin, Hesheng; Velenis, Dimitrios; Nolmans, Philip; Sun, Xiao; Catthoor, Francky; Lauwereins, Rudy; Van der Plas, Geert; Beyne, Eric (2021)

Backside power delivery with a direct 14:1/19:1 high-ratio point-of-load power converter for servers and datacenters

Lin, Hesheng; Hiblot, Gaspard; Sun, Xiao; Talmelli, Giacomo; Velenis, Dimitrios; Bex, Pieter; Adelmann, Christoph; Lauwereins, Rudy; Catthoor, Francky; Van der Plas, Geert; Beyne, Eric (2021)

BESOCIAL: A sustainable knowledge graph-based workflow for social media archiving

Lieber, Sven; Van Assche, Dylan; Chambers, S.; Messens, F.; Geeraert, F.; Birkholz, J.M.; Dimou, Anastasia (2021)

Optimization of multi-beam silicon photonics based laser Doppler vibrometry for measuring cardiovascular signals on bare skin

Li, YanLu; Aasmul, Soren; Morrissey, Padraic E.; Wotherspoon, Tracy; Zaruba, Petr; Baets, Roel (2021-03)

Challenges in uniform etching of Ruthenium

Le, Quoc Toan; Verdonck, Patrick; Pacco, Antoine; Altamirano Sanchez, Efrain (2021)

Effect of surface chemistry on Ruthenium wet etching

Le, Quoc Toan; Kesters, Els; Doms, Mathias; Altamirano Sanchez, Efrain (2021)

Physics-informed recurrent neural networks for the identification of a generic energy buffer system

Lahariya, Manu; Farzaneh, K.; Develder, Chris; Crevecoeur, G. (2021)

A 10.1 ENOB, 6.2fJ/con.-step, 500MS/s ringamp-based pipelined-SAR ADC with background calibration and dynamic reference regulation in 16nm CMOS

Lagos Benites, Jorge; Markulic, Nereo; Hershberg, Benjamin; Dermit, Davide; Shrivas, Mithlesh; Martens, Ewout; Craninckx, Jan (2021)

Massive metrology and inspection solution for EUV by area inspection SEM with machine learning technology

Kondo, Tsuyoshi; Ban, N.; Ebizuka, Y.; Toyoda, Y.; Yamada, Y.; Kashiwa, T.; Koike, H.; Shindo, H.; Charley, Anne-Laure; Saib, Mohamed; Van Roey, Frieda; De Bisschop, Peter; De Simone, Danilo; Beral, Christophe; Lorusso, Gian (2021)

Conference contributions: Recent submissions

Solid-state lithium and Li-ion batteries with silica-gel solid nanocomposite electrolytes ﻿

Self-supervised exploration via latent Bayesian surprise ﻿

A compact 8-bit, 8 GS/s 8xTI SAR ADC in 16 nm with 45 dB SNDR and 5 GHz ERBW ﻿

5G-Blueprint: Next Generation Connectivity for Enhanced, Safe, Efficient Transport & Logistics ﻿

Design and Manufacturing Technology of Advanced Multi-Die Packages on the 'Slope of Enlightenment': Where Is 3D-Test? ﻿

QD-Based Sensors for Infrared Imaging ﻿

Diagnosing and Removing CD-SEM Metrology Artifacts ﻿

TADF OLED Emission Zone and Stability Analysis with Water Exposure to Different Layers during Deposition ﻿

GPS-Assisted Feature Matching in Aerial Images with Highly Repetitive Patterns ﻿

The unavoidable renaissance of electron metrology in the age of High NA EUV ﻿

VIS-SWIR wideband lens-free imaging ﻿

91.5%-Efficiency fully integrated voltage regulator with 86fF/μm2-high-density 2.5 MIM capacitor ﻿

Backside power delivery with a direct 14:1/19:1 high-ratio point-of-load power converter for servers and datacenters ﻿

BESOCIAL: A sustainable knowledge graph-based workflow for social media archiving ﻿

Optimization of multi-beam silicon photonics based laser Doppler vibrometry for measuring cardiovascular signals on bare skin ﻿

Challenges in uniform etching of Ruthenium ﻿

Effect of surface chemistry on Ruthenium wet etching ﻿

Physics-informed recurrent neural networks for the identification of a generic energy buffer system ﻿

A 10.1 ENOB, 6.2fJ/con.-step, 500MS/s ringamp-based pipelined-SAR ADC with background calibration and dynamic reference regulation in 16nm CMOS ﻿

Massive metrology and inspection solution for EUV by area inspection SEM with machine learning technology ﻿