Recently added

Deep fingerprinting: undermining website fingerprinting defenses with deep learning

Sirinam, Payap; Imani, Mohsen; Juarez, Marc; Wright, Mattherw; Joosen, Wouter (2018)

Poster: Knowledge-enriched security and privacy threat modeling

Sion, Laurens; Yskout, Koen; Van landuyt, Dimitri; Joosen, Wouter (2018)

Risk-based design security analysis

Sion, Laurens; Yskout, Koen; Van landuyt, Dimitri; Joosen, Wouter (2018)

Solution-aware data flow diagrams for security threat modelling

Sion, Laurens; Yskout, Koen; Van landuyt, Dimitri; Joosen, Wouter (2018)

Interaction-based privacy threat elicitation

Sion, Laurens; Wuyts, Kim; Yskout, Koen; Van landuyt, Dimitri; Joosen, Wouter (2018)

SPARTA: Security & privacy architecture through risk-driven threat assessment

Sion, Laurens; Van landuyt, Dimitri; Yskout, Koen; Joosen, Wouter (2018)

Laser doping from PSG for selective FSF of screen printed rear-junction n-PERT cells

Singh, Sukhvinder; Tous, Loic; Choulat, Patrick; Chen, Jia; Liu, Ronglin; Ma, Liming; Wu, Xinghua; Wang, Jianming; Liu, Zhifeng; Duerinckx, Filip; Gordon, Ivan; Szlufcik, Jozef; Poortmans, Jef (2018)

Smart switchable biological surfaces for on-demand biosensing

Simoes, Barbara; Adriaensens, Peter; Guedens, Wanda; Goodwin, Paul; Mendes, Paula (2018)

On the low-frequency noise of high-k gate stacks: what did we learn?

Simoen, Eddy; Ritzenthaler, Romain; Schram, Tom; Arimura, Hiroaki; Horiguchi, Naoto; Claeys, Cor (2018)

Do we have to worry about extended defects in high-mobility materials?

Simoen, Eddy; Hsu, Brent; He, Liang; Mols, Yves; Kunert, Bernardette; Langer, Robert; Waldron, Niamh; Eneman, Geert; Collaert, Nadine; Heyns, Marc; Claeys, Cor (2018)

Impact of defects on transport in nanodevices

Simoen, Eddy; Hsu, Brent; Boudier, Dimitri; Cretu, Bogdan; Eneman, Geert; Collaert, Nadine; Claeys, Cor (2018-06)

Low-frequency noise assessment 0f 1.8 V input-output bulk FinFETs with ALD SiO2

Simoen, Eddy; Hellings, Geert; Parvais, Bertrand; Ragnarsson, Lars-Ake; Dekkers, Harold; Schram, Tom; Linten, Dimitri; Horiguchi, Naoto (2018)

Electrically active defects in plated crystalline silicon n+p solar cells: a DLTS perspective

Simoen, Eddy; Dang Thi Thuy, Chi; Labie, Riet; Poortmans, Jef (2018)

Metal contamination in semiconductor devices: a never ending story?

Simoen, Eddy; Claeys, Cor (2018)

ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology

Simicic, Marko; Hellings, Geert; Chen, Shih-Hung; Horiguchi, Naoto; Linten, Dimitri (2018)

ESD performance comparison of superlattice I/O FinFET and horizontal nanowire devices

Simicic, Marko; Chen, Shih-Hung; Hellings, Geert; Linten, Dimitri (2018)

Towards efficient and automated side channel evaluations at design time

Sijcic, Danilo; Balasch, Josep; Yang, Bohan; Ghosh, Santosh; Verbauwhede, Ingrid (2018)

RGB-NIR demosaicing using deep residual U-net

Shopovska, Ivana; Jovanov, Ljubomir; Philips, Wilfried (2018)

Vacuum-ultraviolet-radiation damage of low-k dielectrics

Shohet, J. Leon; Kim, Sang-Heum; Nguyen, Ha; Xue, Panpan; Blatz, Joshua; Cheng, Haoyu; Lin, Yi-Hung; de Marneffe, Jean-Francois; Redzheb, Murad; Armini, Silvia; Chen, Cheng-chi; Wu, Yuting (2018)

Industrial indoor massive MIMO human EM-exposure evaluation

Shikhantsov, Sergei; Thielens, Arno; Vermeeren, Gunter; Tanghe, Emmeric; Demeester, Piet; Torfs, Guy; Martens, Luc; Joseph, Wout (2018)

Conference contributions: Recent submissions

Deep fingerprinting: undermining website fingerprinting defenses with deep learning ﻿

Poster: Knowledge-enriched security and privacy threat modeling ﻿

Risk-based design security analysis ﻿

Solution-aware data flow diagrams for security threat modelling ﻿

Interaction-based privacy threat elicitation ﻿

SPARTA: Security & privacy architecture through risk-driven threat assessment ﻿

Laser doping from PSG for selective FSF of screen printed rear-junction n-PERT cells ﻿

Smart switchable biological surfaces for on-demand biosensing ﻿

On the low-frequency noise of high-k gate stacks: what did we learn? ﻿

Do we have to worry about extended defects in high-mobility materials? ﻿

Impact of defects on transport in nanodevices ﻿

Low-frequency noise assessment 0f 1.8 V input-output bulk FinFETs with ALD SiO2 ﻿

Electrically active defects in plated crystalline silicon n+p solar cells: a DLTS perspective ﻿

Metal contamination in semiconductor devices: a never ending story? ﻿

ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology ﻿

ESD performance comparison of superlattice I/O FinFET and horizontal nanowire devices ﻿

Towards efficient and automated side channel evaluations at design time ﻿

RGB-NIR demosaicing using deep residual U-net ﻿

Vacuum-ultraviolet-radiation damage of low-k dielectrics ﻿

Industrial indoor massive MIMO human EM-exposure evaluation ﻿

Deep fingerprinting: undermining website fingerprinting defenses with deep learning

Poster: Knowledge-enriched security and privacy threat modeling

Risk-based design security analysis

Solution-aware data flow diagrams for security threat modelling

Interaction-based privacy threat elicitation

SPARTA: Security & privacy architecture through risk-driven threat assessment

Laser doping from PSG for selective FSF of screen printed rear-junction n-PERT cells

Smart switchable biological surfaces for on-demand biosensing

On the low-frequency noise of high-k gate stacks: what did we learn?

Do we have to worry about extended defects in high-mobility materials?

Impact of defects on transport in nanodevices

Low-frequency noise assessment 0f 1.8 V input-output bulk FinFETs with ALD SiO2

Electrically active defects in plated crystalline silicon n+p solar cells: a DLTS perspective

Metal contamination in semiconductor devices: a never ending story?

ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology

ESD performance comparison of superlattice I/O FinFET and horizontal nanowire devices

Towards efficient and automated side channel evaluations at design time

RGB-NIR demosaicing using deep residual U-net

Vacuum-ultraviolet-radiation damage of low-k dielectrics

Industrial indoor massive MIMO human EM-exposure evaluation