Recently added

Selective isotropic etching of Group IV semiconductors to enable gate all around device architectures

Kal, Subhadeep; Pereira, Cheryl; Oniki, Yusuke; Holsteyns, Frank; Smith, Jeffrey; Mosden, Aelan; Kumar, Kaushik; Biolsi, Peter; Hurd, Trace Q. (2018)

Machine learning for fast characterization of magnetic logic devices

Kaintura, Arun; Foss, Kyle; Couckuyt, Ivo; Dhaene, Tom; Zografos, Odysseas; Vaysset, Adrien; Soree, Bart (2018)

Negative field dependent charge mobility in crystalline organic semiconductors with delocalized transport

Kadashchuk, Andriy; Fishchuk, Ivan (2018)

Modern trends in nanoelectronics

Kadashchuk, Andriy (2018-08)

Optoelectronic properties of wide-bandgap hybrid organicinorganic perovskite films

Kadashchuk, Andriy (2018-10)

A highly miniturized single-chip MOEMS scanner for all-in-one imaging solution

Jovic, a.; Uto, T.; Hei, Kefei; Sancho, J.; Sanchez, Nuria; Zinoviev, Kirill; Rubio, Jose L.; Margaloo, E.; Pandraud, G.; Sarro, P.M. (2018)

Real-time spatially adaptive deconvolution for CFA images

Jovanov, Ljubomir; Philips, Wilfried (2018)

Real time demosaicking and superresolution of multispectral images

Jovanov, Ljubomir; Philips, Wilfried (2018)

Cu resistivity and intrinsic EM-reliability study in Ta/Cu, Co/Cu and Ru/Cu systems for advanced BEOL Cu interconnections

Jourdan, Nicolas; Varela Pedreira, Olalla; van der Veen, Marleen; Adelmann, Christoph; Van Elshocht, Sven; Tokei, Zsolt (2018)

Extreme thinning of Si wafers for via-last and multi wafer stacking applications

Jourdain, Anne; De Vos, Joeri; Rassoul, Nouredine; Zahedmanesh, Houman; Miller, Andy; Beyer, Gerald; Beyne, Eric; Walsby, Edward; Patel, Jash; Ansell, Oliver; Ashraf, Huma; Thomas, Dave; Li, Shifang; Chang, Timothy; Hiebert, Stephen; Cross, Andrew; Stoerring, Moritz (2018)

QGIS calculation method for evaluation of ELF electromagnetic field exposure of general public due to overhead power lines

Joseph, Wout; Vanhecke, Kris; Geuzaine, Christophe; Verloock, Leen; Van den Bossche, Matthias 2; Verlaek, Mart; Goethals, Michel; Martens, Luc (2018)

Hierarchical learning of sparse image representations using steered mixture-of-experts

Jongebloed, R.; Verhack, Ruben; Lange, L.; Sikora, T. (2018)

Blank defect coverage budget for 16nm half-pitch single EUV exposure

Jonckheere, Rik; Yamane, Takeshi; Morikawa, Yasutaka; Kamo, Takashi (2018)

The Impact of Advanced Texturing on Saturation Current Density in n-Type PERT Silicon Solar Cell Processing

John, Joachim; Jamalbadini, S.; Haslinger, M.; Gocyla, Mateusz; Hajjiah, A.; Kuzma Filipek, Izabela; Tous, Loic; Russell, Richard; Duerinckx, Filip; Szlufcik, Jozef; Poortmans, Jef (2018)

Radio hardware virtualization for coping with dynamic heterogeneous wireless environments

Jiao, Xianjun; Moerman, Ingrid; Liu, Wei; Pereira de Figueiredo, Felipe (2018-09)

A machine learning approach for IEEE 802.11 channel allocation

Jeunen, Olivier; Bosch, Patrick; Van Herwegen, Michiel; Van Doorselaer, Karel; Godman, Nick; Latre, Steven (2018)

Efficient, large-area scalable Perovskite-Si and Perovskite-CIGS tandem solar modules

Jaysankar, Manoj; Paetel, Stefan; Debucquoy, Maarten; Ahlswede, Erik; Gehlhaar, Robert; Poortmans, Jef (2018)

Nb2O5 as waveguide material for visible light photonic integrated circuits

Jayachandran, Suseendran; Lenci, Silvia; Lodewijks, Kristof; Kongnyuy, Tangla David; Leyssens, Kenny; Paraschiv, Vasile (2018)

Context-aware stress detection

Janssens, Olivier; Smets, Elena; Schiavone, Giuseppina; Rios Velazquez, Emmanuel; Ongenae, Femke; De Raedt, Walter; Van Hoof, Chris; Van Hoecke, Sofie (2018)

Outdoor fingerprinting localization using Sigfox

Janssen, Thomas; Aernouts, Michiel; Berkvens, Rafael; Weyn, Maarten (2018)

Conference contributions: Recent submissions

Selective isotropic etching of Group IV semiconductors to enable gate all around device architectures ﻿

Machine learning for fast characterization of magnetic logic devices ﻿

Negative field dependent charge mobility in crystalline organic semiconductors with delocalized transport ﻿

Modern trends in nanoelectronics ﻿

Optoelectronic properties of wide-bandgap hybrid organicinorganic perovskite films ﻿

A highly miniturized single-chip MOEMS scanner for all-in-one imaging solution ﻿

Real-time spatially adaptive deconvolution for CFA images ﻿

Real time demosaicking and superresolution of multispectral images ﻿

Cu resistivity and intrinsic EM-reliability study in Ta/Cu, Co/Cu and Ru/Cu systems for advanced BEOL Cu interconnections ﻿

Extreme thinning of Si wafers for via-last and multi wafer stacking applications ﻿

QGIS calculation method for evaluation of ELF electromagnetic field exposure of general public due to overhead power lines ﻿

Hierarchical learning of sparse image representations using steered mixture-of-experts ﻿

Blank defect coverage budget for 16nm half-pitch single EUV exposure ﻿

The Impact of Advanced Texturing on Saturation Current Density in n-Type PERT Silicon Solar Cell Processing ﻿

Radio hardware virtualization for coping with dynamic heterogeneous wireless environments ﻿

A machine learning approach for IEEE 802.11 channel allocation ﻿

Efficient, large-area scalable Perovskite-Si and Perovskite-CIGS tandem solar modules ﻿

Nb2O5 as waveguide material for visible light photonic integrated circuits ﻿

Context-aware stress detection ﻿

Outdoor fingerprinting localization using Sigfox ﻿