Recently added

Cell-aware test:significant test quality improvement at affordable cost

Gao, Zhan; Marinissen, Erik Jan; Huisken, Jos; Goossens, Kees; Wisnesky, Carl; Swenton, Joe (2018-05)

Double patterning at NA 0.33 versus high-NA single exposure in EUV lithography: an imaging comparison

Gao, Weimin; Wiaux, Vincent; Hoppe, Wolfgang; Philipsen, Vicky; Melvin, Lawrence; Hendrickx, Eric; Lucas, Kevin; Kim, Ryan Ryoung han (2018)

Simulation and characterization of a high-sensitive micro-opto-mechanical microphone

Gao, Hang; Huang, Chih Hsien; Westerveld, Wouter; Haouari, Rachid; Troia, Benedetto; Verhaegen, Fabian; Jansen, Roelof; Figeys, Bruno; Rottenberg, Xavier; Rochus, Veronique (2018)

The Odyssey: modeling privacy threats in a brave new world

Galvez, Rafael; Gurses, Seda (2018)

From craft to science: The road ahead for empirical software engineering research

Galster, Matthias; Weyns, Danny; Tang, Antony; Kazman, Rick; Mirakhorli, Mehdi (2018)

CNTs in the context of EUV pellicle history

Gallagher, Emily; Timmermans, Marina; Pollentier, Ivan; Lee, Jae Uk; Mariano Juste, Marina; Adelmann, Christoph; Huyghebaert, Cedric; Scholze, Frank; Laubis, Christian (2018)

Gas phase pore stuffing for the protection of organo-silicate glass dielectric materials

Fujikawa, Makoto; de Marneffe, Jean-Francois; Chanson, Romain; Babaei Gavan, Khashayar; Rezvanov, Askar; Lazzarino, Frederic; Tokei, Zsolt; Yamaguchi, T.; Nozawa, N.; Sato, Nagisa (2018)

Gas Phase Pore Stuffing (GPPS)

Fujikawa, M; Yamaguchi, T; Nozawa, S; Niino, R; Chanson, Romain; Babaei Gavan, Khashayar; Lazzarino, Frederic; de Marneffe, Jean-Francois (2018)

Improving Time Series Prediction with Ensembles of Integrated Photonic Reservoirs

Freiberger, Matthias; Bienstman, Peter; Dambre, Joni (2018)

Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument

Franquet, Alexis; Spampinato, Valentina; Kayser, Sven; Havelund, Rasmus; Gilmore, Ian; Vandervorst, Wilfried; van der Heide, Paul (2018)

Who left open the cookie jar? A comprehensive evaluation of third-party cookie policies

Franken, Gertjan; Van Goethem, Tom; Joosen, Wouter (2018)

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration

Franco, Jacopo; Wu, Zhicheng; Rzepa, Gerhard; Vandooren, Anne; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Hellings, Geert; Brus, Stephan; Cott, Daire; De Heyn, Vincent; Groeseneken, Guido; Horiguchi, Naoto; Ryckaert, Julien; Collaert, Nadine; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2018-12)

Conference contributions: Recent submissions

Cell-aware test:significant test quality improvement at affordable cost

Double patterning at NA 0.33 versus high-NA single exposure in EUV lithography: an imaging comparison

Simulation and characterization of a high-sensitive micro-opto-mechanical microphone

The Odyssey: modeling privacy threats in a brave new world

From craft to science: The road ahead for empirical software engineering research

CNTs in the context of EUV pellicle history

Gas phase pore stuffing for the protection of organo-silicate glass dielectric materials

Gas Phase Pore Stuffing (GPPS)

Improving Time Series Prediction with Ensembles of Integrated Photonic Reservoirs

Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument

Who left open the cookie jar? A comprehensive evaluation of third-party cookie policies

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration

On the impact of the gate metal work-function on the charge trapping component of BTI

Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space

A BLAS-based algorithm for finding position weight matrix occurrences in DNA sequences on CPUs and GPUs

Zero and one-dimensional electrical characterization of nanometer-wide Si fins

Towards carrier profiling in nanometer-wide Si fins with micro four-point probe

Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solution

Investigation of the endurance of FE-HfO2 devices by means of TDDB studies

Vertical ferroelectric HfO2 FET based on 3-D NAND architecture: towards dense low-power memory

Conference contributions: Recent submissions

Cell-aware test:significant test quality improvement at affordable cost ﻿

Double patterning at NA 0.33 versus high-NA single exposure in EUV lithography: an imaging comparison ﻿

Simulation and characterization of a high-sensitive micro-opto-mechanical microphone ﻿

The Odyssey: modeling privacy threats in a brave new world ﻿

From craft to science: The road ahead for empirical software engineering research ﻿

CNTs in the context of EUV pellicle history ﻿

Gas phase pore stuffing for the protection of organo-silicate glass dielectric materials ﻿

Gas Phase Pore Stuffing (GPPS) ﻿

Improving Time Series Prediction with Ensembles of Integrated Photonic Reservoirs ﻿

Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument ﻿

Who left open the cookie jar? A comprehensive evaluation of third-party cookie policies ﻿

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration ﻿

On the impact of the gate metal work-function on the charge trapping component of BTI ﻿

Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space ﻿

A BLAS-based algorithm for finding position weight matrix occurrences in DNA sequences on CPUs and GPUs ﻿

Zero and one-dimensional electrical characterization of nanometer-wide Si fins ﻿

Towards carrier profiling in nanometer-wide Si fins with micro four-point probe ﻿

Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solution ﻿

Investigation of the endurance of FE-HfO2 devices by means of TDDB studies ﻿

Vertical ferroelectric HfO2 FET based on 3-D NAND architecture: towards dense low-power memory ﻿

Cell-aware test:significant test quality improvement at affordable cost

Double patterning at NA 0.33 versus high-NA single exposure in EUV lithography: an imaging comparison

Simulation and characterization of a high-sensitive micro-opto-mechanical microphone

The Odyssey: modeling privacy threats in a brave new world

From craft to science: The road ahead for empirical software engineering research

CNTs in the context of EUV pellicle history

Gas phase pore stuffing for the protection of organo-silicate glass dielectric materials

Gas Phase Pore Stuffing (GPPS)

Improving Time Series Prediction with Ensembles of Integrated Photonic Reservoirs

Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument

Who left open the cookie jar? A comprehensive evaluation of third-party cookie policies

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration

On the impact of the gate metal work-function on the charge trapping component of BTI

Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space

A BLAS-based algorithm for finding position weight matrix occurrences in DNA sequences on CPUs and GPUs

Zero and one-dimensional electrical characterization of nanometer-wide Si fins

Towards carrier profiling in nanometer-wide Si fins with micro four-point probe

Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solution

Investigation of the endurance of FE-HfO2 devices by means of TDDB studies

Vertical ferroelectric HfO2 FET based on 3-D NAND architecture: towards dense low-power memory