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dc.contributor.authorBhattacharya, Sarani
dc.contributor.authorVerbauwhede, Ingrid
dc.date.accessioned2022-07-18T02:27:52Z
dc.date.available2022-07-18T02:27:52Z
dc.date.issued2021
dc.identifier.otherWOS:000805289900117
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40135
dc.sourceWOS
dc.titleExploring Micro-architectural Side-Channel Leakages through Statistical Testing
dc.typeProceedings paper
dc.identifier.eisbn978-3-9819263-5-4
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.beginpage633
dc.source.endpage636
dc.source.conferenceDesign, Automation and Test in Europe Conference and Exhibition (DATE)
dc.source.conferencedateFEB 01-05, 2021
imec.availabilityUnder review


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