Notice

This item has not yet been validated by imec staff.

Notice

This is not the latest version of this item. The latest version can be found at: https://imec-prod.atmire.com/handle/20.500.12860/40651.2

Show simple item record

Impact of the channel doping on the low-frequency noise of silicon vertical nanowire pFETs

dc.contributor.authorSimoen, Eddy
dc.contributor.authorVeloso, Anabela
dc.contributor.authorMatagne, Philippe
dc.contributor.authorClaeys, Cor
dc.date.accessioned2022-10-30T02:55:16Z
dc.date.available2022-10-30T02:55:16Z
dc.date.issued2022-AUG
dc.identifier.issn0038-1101
dc.identifier.otherWOS:000868453300002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40651
dc.sourceWOS
dc.titleImpact of the channel doping on the low-frequency noise of silicon vertical nanowire pFETs
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.identifier.doi10.1016/j.sse.2022.108318
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.volume194
imec.availabilityUnder review


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record

Version history

VersionItemDateSummary
220.500.12860/40651.22023-04-06T13:16:32Zvalidation by library/open access desk
120.500.12860/40651*2022-10-30T02:55:16Z

*Selected version