| dc.contributor.author | D'hooge, Laurens | |
| dc.contributor.author | Verkerken, Miel | |
| dc.contributor.author | Volckaert, Bruno | |
| dc.contributor.author | Wauters, Tim | |
| dc.contributor.author | De Turck, Filip | |
| dc.date.accessioned | 2023-05-17T08:28:54Z | |
| dc.date.available | 2022-11-12T03:03:37Z | |
| dc.date.available | 2022-11-14T11:04:33Z | |
| dc.date.available | 2023-05-17T08:28:54Z | |
| dc.date.issued | 2022 | |
| dc.identifier.isbn | 978-3-031-09483-5 | |
| dc.identifier.issn | 0302-9743 | |
| dc.identifier.other | WOS:000876748600002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40718.3 | |
| dc.source | WOS | |
| dc.title | Establishing the Contaminating Effect of Metadata Feature Inclusion in Machine-Learned Network Intrusion Detection Models | |
| dc.type | Proceedings paper | |
| dc.contributor.imecauthor | D'hooge, Laurens | |
| dc.contributor.imecauthor | Verkerken, Miel | |
| dc.contributor.imecauthor | Volckaert, Bruno | |
| dc.contributor.imecauthor | Wauters, Tim | |
| dc.contributor.imecauthor | De Turck, Filip | |
| dc.contributor.orcidimec | D'hooge, Laurens::0000-0001-5086-6361 | |
| dc.contributor.orcidimec | Verkerken, Miel::0000-0002-1781-900X | |
| dc.contributor.orcidimec | Volckaert, Bruno::0000-0003-0575-5894 | |
| dc.contributor.orcidimec | Wauters, Tim::0000-0003-2618-3311 | |
| dc.contributor.orcidimec | De Turck, Filip::0000-0003-4824-1199 | |
| dc.date.embargo | 2023-06-24 | |
| dc.identifier.doi | 10.1007/978-3-031-09484-2_2 | |
| dc.identifier.eisbn | 978-3-031-09484-2 | |
| dc.source.numberofpages | 19 | |
| dc.source.peerreview | yes | |
| dc.source.beginpage | 23 | |
| dc.source.endpage | 41 | |
| dc.source.conference | 19th International Conference on Detection of Intrusions and Malware and Vulnerability Assessment (DIMVA) | |
| dc.source.conferencedate | JUN 29-JUL 01, 2022 | |
| dc.source.conferencelocation | Cagliari | |
| dc.source.journal | Lecture Notes in Computer Science | |
| dc.source.volume | 13358 | |
| imec.availability | Published - imec | |