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First-principles-based screening method for resistivity scaling of anisotropic metals
| dc.contributor.author | Moors, Kristof | |
| dc.contributor.author | Sankaran, Kiroubanand | |
| dc.contributor.author | Pourtois, Geoffrey | |
| dc.contributor.author | Adelmann, Christoph | |
| dc.date.accessioned | 2023-01-23T14:57:08Z | |
| dc.date.available | 2023-01-18T03:17:48Z | |
| dc.date.available | 2023-01-23T14:57:08Z | |
| dc.date.issued | 2022-12-23 | |
| dc.identifier.issn | 2475-9953 | |
| dc.identifier.other | WOS:000906548400002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40991.2 | |
| dc.source | WOS | |
| dc.title | First-principles-based screening method for resistivity scaling of anisotropic metals | |
| dc.type | Journal article | |
| dc.contributor.imecauthor | Sankaran, Kiroubanand | |
| dc.contributor.imecauthor | Pourtois, Geoffrey | |
| dc.contributor.imecauthor | Adelmann, Christoph | |
| dc.contributor.orcidext | https://orcid.org/0000-0002-8682-5286 | |
| dc.contributor.orcidimec | Sankaran, Kiroubanand::0000-0001-6988-7269 | |
| dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
| dc.contributor.orcidimec | Adelmann, Christoph::0000-0002-4831-3159 | |
| dc.identifier.doi | 10.1103/PhysRevMaterials.6.123804 | |
| dc.source.numberofpages | 10 | |
| dc.source.peerreview | yes | |
| dc.source.beginpage | 123804-1 | |
| dc.source.endpage | 123804-10 | |
| dc.source.journal | PHYSICAL REVIEW MATERIALS | |
| dc.source.issue | 12 | |
| dc.source.volume | 6 | |
| imec.availability | Under review |