Notice
This item has not yet been validated by imec staff.
Notice
This is not the latest version of this item. The latest version can be found at: https://imec-prod.atmire.com/handle/20.500.12860/41151.2
Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery
| dc.contributor.author | Bastos, J. P. | |
| dc.contributor.author | O'Sullivan, B. J. | |
| dc.contributor.author | Franco, J. | |
| dc.contributor.author | Tyaginov, S. | |
| dc.contributor.author | Truijen, B. | |
| dc.contributor.author | Chasin, A. | |
| dc.contributor.author | Degraeve, R. | |
| dc.contributor.author | Kaczer, B. | |
| dc.contributor.author | Ritzenthaler, R. | |
| dc.contributor.author | Capogreco, E. | |
| dc.contributor.author | Litta, E. D. | |
| dc.contributor.author | Spessot, A. | |
| dc.contributor.author | Higashi, Y. | |
| dc.contributor.author | Yoon, Y. | |
| dc.contributor.author | Machkaoutsan, V. | |
| dc.contributor.author | Fazan, P. | |
| dc.contributor.author | Horiguchi, N. | |
| dc.date.accessioned | 2023-02-27T03:27:53Z | |
| dc.date.available | 2023-02-27T03:27:53Z | |
| dc.date.issued | 2022 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.other | WOS:000922926400119 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41151 | |
| dc.source | WOS | |
| dc.title | Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery | |
| dc.type | Proceedings paper | |
| dc.contributor.imecauthor | Bastos, J. P. | |
| dc.contributor.imecauthor | O'Sullivan, B. J. | |
| dc.contributor.imecauthor | Franco, J. | |
| dc.contributor.imecauthor | Tyaginov, S. | |
| dc.contributor.imecauthor | Truijen, B. | |
| dc.contributor.imecauthor | Chasin, A. | |
| dc.contributor.imecauthor | Degraeve, R. | |
| dc.contributor.imecauthor | Kaczer, B. | |
| dc.contributor.imecauthor | Ritzenthaler, R. | |
| dc.contributor.imecauthor | Capogreco, E. | |
| dc.contributor.imecauthor | Litta, E. D. | |
| dc.contributor.imecauthor | Spessot, A. | |
| dc.contributor.imecauthor | Higashi, Y. | |
| dc.contributor.imecauthor | Yoon, Y. | |
| dc.contributor.imecauthor | Machkaoutsan, V. | |
| dc.contributor.imecauthor | Fazan, P. | |
| dc.contributor.imecauthor | Horiguchi, N. | |
| dc.identifier.doi | 10.1109/IRPS48227.2022.9764547 | |
| dc.identifier.eisbn | 978-1-6654-7950-9 | |
| dc.source.numberofpages | 6 | |
| dc.source.peerreview | yes | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 27-31, 2022 | |
| dc.source.conferencelocation | Dallas | |
| imec.availability | Under review |
Files in this item
| Files | Size | Format | View |
|---|---|---|---|
|
There are no files associated with this item. |
|||