Notice

This item has not yet been validated by imec staff.

Notice

This is not the latest version of this item. The latest version can be found at: https://imec-prod.atmire.com/handle/20.500.12860/41158.2

Show simple item record

Advanced CMOS Technology Challenges for Robust ESD Design

dc.contributor.authorChen, Shih-Hung
dc.date.accessioned2023-02-27T03:28:05Z
dc.date.available2023-02-27T03:28:05Z
dc.date.issued2022
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000922926400183
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41158
dc.sourceWOS
dc.titleAdvanced CMOS Technology Challenges for Robust ESD Design
dc.typeMeeting abstract
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.orcidimecChen, Shih-Hung::0000-0002-6481-2951
dc.identifier.eisbn978-1-6654-7950-9
dc.source.numberofpages2
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 27-31, 2022
dc.source.conferencelocationDallas
imec.availabilityUnder review


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record

Version history

VersionItemDateSummary
220.500.12860/41158.22023-04-25T10:10:36Zvalidation by library/open access desk
120.500.12860/41158*2023-02-27T03:28:05Z

*Selected version