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Low frequency noise as a diagnostic tool for quality assessment for MOSFETs

dc.contributor.authorVandamme, Ewout
dc.contributor.authorClaeys, Cor
dc.contributor.authorVandamme, L.
dc.date.accessioned2021-09-29T12:50:35Z
dc.date.available2021-09-29T12:50:35Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/411
dc.sourceIIOimport
dc.titleLow frequency noise as a diagnostic tool for quality assessment for MOSFETs
dc.typeOral presentation
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference1st ELEN Workshop on Noise in Electronic Systems
dc.source.conferencedate18/10/1994
dc.source.conferencelocationMontpellier France
imec.availabilityPublished - open access


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