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Impact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters

dc.contributor.authorTsiara, Artemisia
dc.contributor.authorKim, Younghyun
dc.contributor.authorYudistira, Didit
dc.contributor.authorKunert, Bernardette
dc.contributor.authorBaryshnikova, Marina
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorCroes, Kristof
dc.date.accessioned2023-05-25T10:00:19Z
dc.date.available2023-03-26T03:50:03Z
dc.date.available2023-05-25T10:00:19Z
dc.date.issued2022
dc.identifier.issnna
dc.identifier.otherWOS:000925380500039
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41378.2
dc.sourceWOS
dc.titleImpact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters
dc.typeProceedings paper
dc.contributor.imecauthorTsiara, Artemisia
dc.contributor.imecauthorKim, Younghyun
dc.contributor.imecauthorYudistira, Didit
dc.contributor.imecauthorKunert, Bemardette
dc.contributor.imecauthorBaryshnikova, Marina
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecTsiara, Artemisia::0000-0002-5612-6468
dc.contributor.orcidimecBaryshnikova, Marina::0000-0002-5945-4459
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecYudistira, Didit::0000-0003-1440-5407
dc.date.embargo2022-09-22
dc.identifier.eisbn978-1-957171-15-9
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceEuropean Conference on Optical Communication (ECOC)
dc.source.conferencedateSEP 18-22, 2022
dc.source.conferencelocationBasel
dc.source.journalna
imec.availabilityPublished - open access
dc.description.wosFundingTextThis work was supported by imec's industrial affiliation R&D program on Optical I/O. In particular, the members of the MCA group are acknowledged for FIB specimen preparation and TEM analysis.


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220.500.12860/41378.2*2023-05-25T09:58:15Zvalidation by library/open access desk
120.500.12860/413782023-03-26T03:50:03Z

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