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Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study

dc.contributor.authorVandemaele, Michiel
dc.contributor.authorKaczer, Ben
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorFranco, Jacopo
dc.contributor.authorBury, Erik
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorMakarov, Alexander
dc.contributor.authorHellings, Geert
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2023-06-29T09:54:16Z
dc.date.available2023-04-30T04:07:24Z
dc.date.available2023-06-29T09:54:16Z
dc.date.issued2023
dc.identifier.issn0741-3106
dc.identifier.otherWOS:000966186700001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41512.2
dc.sourceWOS
dc.titleTrapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study
dc.typeJournal article
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorMakarov, Alexander
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecMakarov, Alexander::0000-0002-9927-6511
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecTyaginov, Stanislav::0000-0002-5348-2096
dc.date.embargo2023-02-01
dc.identifier.doi10.1109/LED.2022.3229763
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.beginpage197
dc.source.endpage200
dc.source.journalIEEE ELECTRON DEVICE LETTERS
dc.source.issue2
dc.source.volume44
imec.availabilityPublished - open access
dc.description.wosFundingTextThe work of M. Vandemaele was supported by the Ph.D. Fellowship of the Research Foundation Flanders (Belgium) under Grant 11A3621N. The review of this letter was arranged by Editor S. Hall. (Corresponding author: M. Vandemaele.)


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220.500.12860/41512.2*2023-06-29T09:46:38Zvalidation by library/open access desk
120.500.12860/415122023-04-30T04:07:24Z

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