Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study

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dc.contributor.author	Vandemaele, M.
dc.contributor.author	Kaczer, B.
dc.contributor.author	Tyaginov, S.
dc.contributor.author	Franco, J.
dc.contributor.author	Bury, E.
dc.contributor.author	Chasin, A.
dc.contributor.author	Makarov, A.
dc.contributor.author	Hellings, G.
dc.contributor.author	Groeseneken, G.
dc.date.accessioned	2023-04-30T04:07:24Z
dc.date.available	2023-04-30T04:07:24Z
dc.date.issued	2023-FEB
dc.identifier.issn	0741-3106
dc.identifier.other	WOS:000966186700001
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/41512
dc.source	WOS
dc.title	Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study
dc.type	Journal article
dc.contributor.imecauthor	Vandemaele, M.
dc.contributor.imecauthor	Kaczer, B.
dc.contributor.imecauthor	Tyaginov, S.
dc.contributor.imecauthor	Franco, J.
dc.contributor.imecauthor	Bury, E.
dc.contributor.imecauthor	Chasin, A.
dc.contributor.imecauthor	Makarov, A.
dc.contributor.imecauthor	Hellings, G.
dc.contributor.imecauthor	Groeseneken, G.
dc.identifier.doi	10.1109/LED.2022.3229763
dc.source.numberofpages	4
dc.source.peerreview	yes
dc.source.beginpage	197
dc.source.endpage	200
dc.source.journal	IEEE ELECTRON DEVICE LETTERS
dc.source.issue	2
dc.source.volume	44
imec.availability	Under review

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Version	Item	Date	Summary
2	20.500.12860/41512.2	2023-06-29T09:46:38Z	validation by library/open access desk
1	20.500.12860/41512*	2023-04-30T04:07:24Z