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dc.contributor.authorChen, Rongmei
dc.contributor.authorLofrano, Melina
dc.contributor.authorMirabelli, Gioele
dc.contributor.authorSisto, Giuliano
dc.contributor.authorYang, Sheng
dc.contributor.authorJourdain, Anne
dc.contributor.authorSchleicher, Filip
dc.contributor.authorVeloso, Anabela
dc.contributor.authorZografos, Odysseas
dc.contributor.authorWeckx, Pieter
dc.contributor.authorHiblot, Gaspard
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorHellings, Geert
dc.contributor.authorRyckaert, Julien
dc.contributor.authorBeyne, Eric
dc.date.accessioned2023-06-01T15:39:18Z
dc.date.available2023-05-25T20:20:00Z
dc.date.available2023-06-01T15:39:18Z
dc.date.issued2022
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000968800700009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41618.2
dc.sourceWOS
dc.titlePower, Performance, Area and Thermal Analysis of 2D and 3D ICs at A14 Node Designed with Back-side Power Delivery Network
dc.typeProceedings paper
dc.contributor.imecauthorChen, Rongmei
dc.contributor.imecauthorLofrano, Melina
dc.contributor.imecauthorMirabelli, Gioele
dc.contributor.imecauthorSisto, Giuliano
dc.contributor.imecauthorYang, Sheng
dc.contributor.imecauthorJourdain, Anne
dc.contributor.imecauthorSchleicher, Filip
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorZografos, Odysseas
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorHiblot, Gaspard
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorRyckaert, Julien
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecMirabelli, Gioele::0000-0001-7060-4836
dc.contributor.orcidimecSisto, Giuliano::0000-0001-8706-4311
dc.contributor.orcidimecYang, Simei::0000-0002-0130-8176
dc.contributor.orcidimecSchleicher, Filip::0000-0003-3630-7285
dc.contributor.orcidimecZografos, Odysseas::0000-0002-9998-8009
dc.contributor.orcidimecHiblot, Gaspard::0000-0002-3869-965X
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.contributor.orcidimecLofrano, Melina::0000-0002-3930-6459
dc.contributor.orcidimecYang, Sheng::0000-0002-0658-5316
dc.contributor.orcidimecJourdain, Anne::0000-0002-7610-0513
dc.identifier.doi10.1109/IEDM45625.2022.10019349
dc.identifier.eisbn978-1-6654-8959-1
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceInternational Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 03-07, 2022
dc.source.conferencelocationSan Francisco
dc.source.journalna
imec.availabilityPublished - imec


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