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Full charge incorporation in ab initio simulations of two-dimensional semiconductor-based devices
| dc.contributor.author | Duflou, Rutger | |
| dc.contributor.author | Houssa, Michel | |
| dc.contributor.author | Afzalian, Aryan | |
| dc.date.accessioned | 2023-06-19T20:36:47Z | |
| dc.date.available | 2023-06-19T20:36:47Z | |
| dc.date.issued | 2023-JUN 8 | |
| dc.identifier.issn | 1569-8025 | |
| dc.identifier.other | WOS:001003159400001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41756 | |
| dc.source | WOS | |
| dc.title | Full charge incorporation in ab initio simulations of two-dimensional semiconductor-based devices | |
| dc.type | Journal article | |
| dc.type | Journal article (pre-print) | |
| dc.contributor.imecauthor | Duflou, Rutger | |
| dc.contributor.imecauthor | Houssa, Michel | |
| dc.contributor.imecauthor | Afzalian, Aryan | |
| dc.contributor.orcidimec | Duflou, Rutger::0000-0002-0357-1293 | |
| dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
| dc.contributor.orcidimec | Afzalian, Aryan::0000-0002-5260-0281 | |
| dc.identifier.doi | 10.1007/s10825-023-02055-3 | |
| dc.source.numberofpages | 13 | |
| dc.source.peerreview | yes | |
| dc.source.journal | JOURNAL OF COMPUTATIONAL ELECTRONICS | |
| imec.availability | Under review |
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