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dc.contributor.authorChoona, Lilach
dc.contributor.authorLinshiz, Jasmine
dc.contributor.authorPres, Shaul
dc.contributor.authorLevant, Boris
dc.contributor.authorTal, Noam
dc.contributor.authorSantoro, Gaetano
dc.contributor.authorBaudot, Sylvain
dc.contributor.authorOpdebeeck, Ann
dc.contributor.authorReifsnider, Jason
dc.contributor.authorVadakupudhu Palayam, Senthil
dc.contributor.authorLorusso, Gian
dc.contributor.authorMitard, Jerome
dc.contributor.authorYogev, Shay
dc.date.accessioned2024-06-06T07:41:30Z
dc.date.available2023-07-28T17:39:56Z
dc.date.available2024-06-06T07:41:30Z
dc.date.issued2023
dc.identifier.isbn978-1-5106-6099-1
dc.identifier.issn0277-786X
dc.identifier.otherWOS:001022962000020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42237.3
dc.sourceWOS
dc.titleDirect yield prediction from SEM images
dc.typeProceedings paper
dc.contributor.imecauthorBaudot, Sylvain
dc.contributor.imecauthorOpdebeeck, Ann
dc.contributor.imecauthorReifsnider, Jason
dc.contributor.imecauthorLorusso, Gian
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorVadakupudhu Palayam, Senthil
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecBaudot, Sylvain::0009-0009-2671-0784
dc.contributor.orcidimecOpdebeeck, Ann::0000-0001-6737-2456
dc.contributor.orcidimecReifsnider, Jason::0000-0002-4248-4037
dc.contributor.orcidimecLorusso, Gian::0000-0003-3498-5082
dc.contributor.orcidimecVadakupudhu Palayam, Senthil::0000-0002-0855-3377
dc.identifier.doi10.1117/12.2658294
dc.identifier.eisbn978-1-5106-6100-4
dc.source.numberofpages9
dc.source.peerreviewyes
dc.source.beginpage124960Q
dc.source.conferenceConference on Metrology, Inspection, and Process Control XXXVII
dc.source.conferencedateFEB 27-MAR 02, 2023
dc.source.conferencelocationSan Jose
dc.source.journalProceedings of SPIE
dc.source.volume12496
imec.availabilityPublished - imec


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