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dc.contributor.authorGalleni, Laura
dc.contributor.authorMeulemans, Arne
dc.contributor.authorSajjadian, Faegheh
dc.contributor.authorSingh, Dhirendra
dc.contributor.authorArvind, Shikhar
dc.contributor.authorDorney, Kevin
dc.contributor.authorConard, Thierry
dc.contributor.authorD'Avino, Gabriele
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorEscudero, Daniel
dc.contributor.authorvan Setten, Michiel
dc.date.accessioned2024-09-19T07:56:55Z
dc.date.available2024-02-07T17:47:22Z
dc.date.available2024-09-19T07:56:55Z
dc.date.issued2024
dc.identifier.issn1948-7185
dc.identifier.otherWOS:001151590500001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43520.2
dc.sourceWOS
dc.titlePeak Broadening in Photoelectron Spectroscopy of Amorphous Polymers: The Leading Role of the Electrostatic Landscape
dc.typeJournal article
dc.contributor.imecauthorGalleni, Laura
dc.contributor.imecauthorArvind, Shikhar
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorSajjadian, Faegheh
dc.contributor.imecauthorSingh, Dhirendra
dc.contributor.imecauthorDorney, Kevin
dc.contributor.imecauthorvan Setten, Michiel
dc.contributor.orcidimecGalleni, Laura::0000-0002-6675-7829
dc.contributor.orcidimecArvind, Shikhar::0000-0002-4748-7763
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecSingh, Dhirendra::0000-0002-8855-0597
dc.contributor.orcidimecDorney, Kevin::0000-0003-2097-6994
dc.contributor.orcidimecvan Setten, Michiel::0000-0003-0557-5260
dc.date.embargo2024-07-18
dc.identifier.doi10.1021/acs.jpclett.3c02640
dc.source.numberofpages6
dc.source.peerreviewyes
dc.source.beginpage834
dc.source.endpage839
dc.source.journalJOURNAL OF PHYSICAL CHEMISTRY LETTERS
dc.identifier.pmidMEDLINE:38235964
dc.source.issue3
dc.source.volume15
imec.availabilityPublished - open access
dc.description.wosFundingTextThe authors acknowledge the contribution of Ilse Hoflijk (Imec) for performing the XPS measurements on PMMA. The authors also acknowledge funding from the Imec Industrial Affiliation Program (IIAP). G.D. acknowledges support from the French "Agence Nationale de la Recherche", project RAPTORS (ANR-21-CE24-0004-01).


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