Show simple item record

Voltage ramp stress based lifetime-prediction model of advanced Al-doped HfO2 dielectric for 2.5D MIMCAPs

dc.contributor.authorFohn, Corinna
dc.contributor.authorChery, Emmanuel
dc.contributor.authorCroes, Kristof
dc.contributor.authorStucchi, Michele
dc.contributor.authorAfanasiev, Valeri
dc.date.accessioned2024-08-06T08:38:57Z
dc.date.available2024-03-07T17:40:27Z
dc.date.available2024-08-06T08:38:57Z
dc.date.issued2024
dc.identifier.issn0038-1101
dc.identifier.otherWOS:001171682400001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43645.2
dc.sourceWOS
dc.titleVoltage ramp stress based lifetime-prediction model of advanced Al-doped HfO2 dielectric for 2.5D MIMCAPs
dc.typeJournal article
dc.contributor.imecauthorFohn, Corinna
dc.contributor.imecauthorChery, Emmanuel
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.orcidimecFohn, Corinna::0000-0002-6182-0147
dc.contributor.orcidimecChery, Emmanuel::0000-0002-2526-3873
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecStucchi, Michele::0000-0002-7848-0492
dc.contributor.orcidimecAfanasiev, Valeri::0000-0001-5018-4539
dc.identifier.doi10.1016/j.sse.2024.108864
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.beginpageArt. 108864
dc.source.endpageN/A
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.issueMarch
dc.source.volume213
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record

Version history

VersionItemDateSummary
220.500.12860/43645.2*2024-08-06T08:37:21Zvalidation by library/open access desk
120.500.12860/436452024-03-07T17:40:27Z

*Selected version