IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair

Abstract

From the Project Authorization Request (PAR) of IEEE Std P3405: "Chiplet-based designs contain dies using proprietary interconnect technology. These dies might come from multiple design groups. Inter-chiplet interconnects are dense, large in number, and prone to manufacturing defects. For cost-effective chiplet packaging, an effective and efficient mechanism to test and repair chiplet interconnects is required. The chiplet interconnect test and repair infrastructure is spread across chiplets and designed by multiple design groups, necessitating the need for a standard for chiplet interconnect test and repair. The purpose of IEEE Std P3405 is to enable interoperability of interconnect test and repair infrastructure of chiplets from multiple design groups. Chiplet-based designs involve multiple parties: Chiplet Maker(s), Packagers, and End User(s). Features supporting the test and repair of chiplet interconnects are part of individual chiplets, which are implemented by individual Chiplet Makers. These features are needed to serve the Chiplet Makers' (pre-packaging), Packagers', and End Users' test and repair objectives."