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Comprehensive Performance and Reliability Assessment of Se-based Selector-Only Memory

dc.contributor.authorRavsher, Taras
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGarbin, Daniele
dc.contributor.authorClima, Sergiu
dc.contributor.authorFantini, Andrea
dc.contributor.authorDonadio, Gabriele Luca
dc.contributor.authorKundu, Shreya
dc.contributor.authorDevulder, Wouter
dc.contributor.authorHody, Hubert
dc.contributor.authorPotoms, Goedele
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2024-09-18T10:15:56Z
dc.date.available2024-08-16T18:28:42Z
dc.date.available2024-09-18T10:15:56Z
dc.date.issued2024
dc.identifier.isbn979-8-3503-6977-9
dc.identifier.issn1541-7026
dc.identifier.otherWOS:001229691100127
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44324.2
dc.sourceWOS
dc.titleComprehensive Performance and Reliability Assessment of Se-based Selector-Only Memory
dc.typeProceedings paper
dc.contributor.imecauthorRavsher, Taras
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorKundu, Shreya
dc.contributor.imecauthorDevulder, Wouter
dc.contributor.imecauthorHody, Hubert
dc.contributor.imecauthorPotoms, Goedele
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorDonadio, Gabriele Luca
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecRavsher, Taras::0000-0001-7862-5973
dc.contributor.orcidimecDegraeve, Robin::0000-0002-4609-5573
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecFantini, Andrea::0000-0002-3220-8856
dc.contributor.orcidimecKundu, Shreya::0000-0001-8052-7774
dc.contributor.orcidimecDevulder, Wouter::0000-0002-5156-0177
dc.contributor.orcidimecHody, Hubert::0009-0000-1407-8755
dc.contributor.orcidimecPotoms, Goedele::0009-0008-0720-0044
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.contributor.orcidimecBelmonte, Attilio::0000-0002-3947-1948
dc.contributor.orcidimecDonadio, Gabriele Luca::0000-0003-1435-3897
dc.contributor.orcidimecAfanasiev, Valeri::0000-0001-5018-4539
dc.identifier.doi10.1109/IRPS48228.2024.10529450
dc.identifier.eisbn979-8-3503-6976-2
dc.source.numberofpages9
dc.source.peerreviewyes
dc.source.conferenceInternational Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 14-18, 2024
dc.source.conferencelocationGrapevine
dc.source.journalN/A
imec.availabilityPublished - imec
dc.description.wosFundingTextThis work was performed within Imec Industrial Affiliation Program on Active Memory Devices and in part supported by Research Foundation-Flanders (FWO) under grant 1SD4721.


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220.500.12860/44324.2*2024-09-18T10:09:38Zvalidation by library/open access desk
120.500.12860/443242024-08-16T18:28:42Z

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