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dc.contributor.authorChen, Huaijin
dc.contributor.authorWang, Zhanwei
dc.contributor.authorLanglois, Kevin
dc.contributor.authorVerstraten, Tom
dc.contributor.authorVanderborght, Bram
dc.date.accessioned2024-10-10T14:43:14Z
dc.date.available2024-09-18T18:03:10Z
dc.date.available2024-10-10T14:43:14Z
dc.date.issued2024
dc.identifier.issn0018-9456
dc.identifier.otherWOS:001301007700009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44521.2
dc.sourceWOS
dc.titleA Structure Modality Enhanced Multimodal Imaging Method for Electrical Impedance Tomography Pressure Distribution Measurement
dc.typeJournal article
dc.contributor.imecauthorChen, Huaijin
dc.contributor.imecauthorWang, Zhanwei
dc.contributor.imecauthorLanglois, Kevin
dc.contributor.imecauthorVanderborght, Bram
dc.contributor.orcidimecWang, Zhanwei::0000-0001-8936-254X
dc.contributor.orcidimecLanglois, Kevin::0000-0002-7991-0976
dc.contributor.orcidimecVanderborght, Bram::0000-0003-4881-9341
dc.date.embargo2024-07-31
dc.identifier.doi10.1109/TIM.2024.3436112
dc.source.numberofpages13
dc.source.peerreviewyes
dc.source.beginpage4507713
dc.source.endpageN/A
dc.source.journalIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
dc.source.issueN/A
dc.source.volume73
imec.availabilityPublished - open access
dc.description.wosFundingTextThe work of Huaijin Chen and Zhanwei Wang was supported by China Scholarship Council (CSC) under Grant 202106830032 and Grant 202006080010. The work of Kevin Langlois was supported by the Wetenschappelijk Onderzoek (FWO) under Grant 1258523N. This work was supported in part by FWO Strategisch Basis Onderzoek(SBO) Sublime under Grant S007423N and in part by the Flemish Government under the Program Onderzoeks programma Artificiele Intelligentie (AI) Vlaanderen.


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