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Calibration during the TCAD development of a high voltage pDEMOS in a sub-μm CMOS technology

dc.contributor.authorVermandel, Miguel
dc.contributor.authorDoutreloigne, Jan
dc.contributor.authorMoens, P.
dc.contributor.authorTack, Marnix
dc.date.accessioned2021-10-14T14:14:26Z
dc.date.available2021-10-14T14:14:26Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4914
dc.sourceIIOimport
dc.titleCalibration during the TCAD development of a high voltage pDEMOS in a sub-μm CMOS technology
dc.typeOral presentation
dc.contributor.imecauthorDoutreloigne, Jan
dc.source.peerreviewno
dc.source.conferenceCHIPPS; March 2000; Wandlitz, Germany.
dc.source.conferencelocation
imec.availabilityPublished - imec


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