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Recent submissions
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imec Publications
Presentations
Recent submissions
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Presentations: Recent submissions
Now showing items 1861-1880 of 4592
Integrated diagnostic sensing at the nanoscale.
Stakenborg, Tim
(
2010
)
Significant enhancement of breakdown voltage for GaN DHFETs by silicon substrate removal
Srivastava, Puneet
;
Das, Jo
;
Visalli, Domenica
;
Van Hove, Marleen
;
Malinowski, Pawel
;
Marcon, Denis
;
Geens, Karen
;
Cheng, Kai
;
Decoutere, Stefaan
;
Mertens, Robert
;
Borghs, Gustaaf
(
2010
)
Thermal modeling and experimental validation of thermal effects of 3D-ICs
Srinivasan, Adi
;
Cheng, Edmund
;
Oprins, Herman
;
Van der Plas, Geert
(
2010
)
Joining in microelectronics
Soussan, Philippe
;
Zhang, Wenqi
(
2010
)
Single dopant effects in ballistic nanowire transistors
Soree, Bart
;
Sels, Dries
;
Groeseneken, Guido
(
2010
)
The junctionless pinch-off transistor: working principle and transport property
Soree, Bart
(
2010
)
Electronic structure, transport and and novel device concepts for nanowires
Soree, Bart
(
2010
)
Experimental realization of subradiant and superradiant resonances in ring/disk plasmonic nanocavities as building blocks for new optical metamaterials
Sonnefraud, Yannick
;
Verellen, Niels
;
Sobhani, Heidar
;
Vandenbosch, Guy
;
Moshchalkov, Victor
;
Van Dorpe, Pol
;
Nordlander, Peter
;
Maier, Stefan
(
2010
)
Formation of self-organized nanodots on GaN surface by Ar-ion implantation
Som, Tapobrata
;
Pereira, L.
;
Skeren, T.
;
Demeulemeester, J.
;
Franquet, Alexis
;
Temst, K.
;
Vantomme, Andre
(
2010
)
Improvement of AlN SAW performance by introduction of TiN nucleation layer on silicon substrate
Soltani, A.
;
Talbi, A.
;
Mortet, Vincent
;
Bassam, A.
;
Oussous, A.
;
Monroy, E.
;
Haenen, Ken
;
de Jaeger, J.C.
;
Pernod, P.
(
2010
)
Surface nanopatterning of metals with low energy ion beam bombardment
Skeren, Tomas
;
Vantomme, Andre
;
Temst, Kristiaan
;
Vandervorst, Wilfried
(
2010
)
Ion beam sputtering of metals: From kinetic roughening to ripple formation
Skeren, Tomas
;
Vandervorst, Wilfried
;
Vantomme, Andre
;
Temst, Kristiaan
(
2010
)
Spacer defined double patterning for 20nm half pitch interconnect damascene structures
Siew, Yong Kong
;
Cockburn, Andrew
;
Beyer, Gerald
;
Versluijs, Janko
;
Kunnen, Eddy
;
Dekkers, Harold
;
Volders, Henny
;
Ciofi, Ivan
;
Gravey, Virginie
;
Noori, Atif
;
Padhi, Deenesh
;
Shah, Kavita
(
2010
)
Evaluation of use of 90nm 6T-SRAM as a PUF for secure key generation in a wireless communication
Selimis, Georgios
;
Konijnenburg, Mario
;
Ashouei, Maryam
;
Huisken, Jos
;
de Groot, Harmke
;
van der Leest, V.
;
Schrijen, G.J.
;
van Hulst, M.
;
Tuyls, P.
(
2010
)
Transient characterization of high voltage switching devices
Scholz, Mirko
;
Linten, Dimitri
;
Thijs, Steven
;
Sawada, Masanori
;
Vashchenko, V.
;
Vandersteen, Gerd
;
Groeseneken, Guido
(
2010
)
ALD of ZrO2, TiO2 and ZrTiO4 thin films from heteroleptic precursors
Schaekers, Marc
;
Opsomer, Karl
;
Rampelberg, Geert
;
Deduytse, Davy
;
Detavernier, Christophe
;
Blasco, Nicolas
;
Zauner, Andy
(
2010
)
Robustness levels of MEMS to electrostatic discharge (ESD) stress - guidelines for protection
Sangameswaran, Sandeep
;
De Coster, Jeroen
;
Witvrouw, Ann
;
Groeseneken, Guido
;
De Wolf, Ingrid
(
2010
)
An integrated measurement set-up to study the impact of atmosphere on ESD in MEMS
Sangameswaran, Sandeep
;
De Coster, Jeroen
;
Cherman, Vladimir
;
Linten, Dimitri
;
Scholz, Mirko
;
Thijs, Steven
;
De Wolf, Ingrid
;
Groeseneken, Guido
(
2010
)
ESD-aspects of FinFETs and other most advanced devices
Russ, Christian
;
Gossner, Harald
;
Thijs, Steven
;
Griffoni, Alessio
(
2010
)
Grating light valves
Rudra, Sukumar
(
2010
)
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