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Presentations
Recent submissions
imec Publications Repository
imec Publications
Presentations
Recent submissions
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Presentations: Recent submissions
Now showing items 2161-2180 of 4592
CARBonCHIP: Carbon nanotubes technology on silicon integrated circuits; some key results
Rapposelli, Paolo
;
Capraro, Bernie
;
Dijon, Jean
;
Cott, Daire
;
Groeseneken, Guido
;
Pinson, Jean
;
Joyeux, Xavier
;
Amadou, Julien
;
Van Noyen, Jasper
;
Sels, Bert
(
2009
)
Sensitized phosphorescence and its application to bulk heterojunction solar cells
Rand, Barry
;
Girotto, Claudio
;
Mityashin, Alexander
;
Hadipour, Afshin
;
Heremans, Paul
;
Genoe, Jan
(
2009
)
Magnetic Resonance Imaging (MRI) - compatibility of chronically implanted microfabricated neural probe: first results
Prodanov, Dimiter
;
Welkenhuysen, Marleen
;
Musa, Silke
;
Himmelreich, U.
;
Nuttin, B.
;
Borghs, Gustaaf
;
Bartic, Carmen
(
2009
)
Optical confinement in crystalline Si solar cells
Poortmans, Jef
(
2009
)
EU policy context for renewables
Poortmans, Jef
(
2009
)
Developing new MEMS opportunities by employing CMOS processing and manufacturing methodologies
Pieters, Philip
(
2009
)
Developing new MEMS opportunities by employing CMOS processing and manufacturing methodologies
Pieters, Philip
(
2009
)
IMEC's strategy and activity on MEMS
Pieters, Philip
(
2009
)
Tip-enhanced Raman and luminescence imaging of treated nanodiamond particles
Petrak, V.
;
Krüger, A.
;
Janssens, S.D.
;
Gregora, I.
;
Kratochvilova, I.
;
Fendrych, F.
;
Haenen, Ken
;
Wagner, Patrick
;
Nesladek, Milos
(
2009
)
Impact of thinning and packaging on a deep sub-micron CMOS product
Perry, Dan
;
Ray, Urmi
;
Gu, Sam
;
Nakamoto, Mark
;
Sy, Wing
;
Wang, Kevin
;
Ruythooren, Wouter
;
Yang, Yu
;
De Wolf, Ingrid
;
Cotrin Teixeira, Ricardo
;
Gonzalez, Mario
;
Simons, Veerle
;
Berry, Christopher J.
;
Lee, KiWook
;
Burggraf, Jürgen
;
Pargfrieder, Stefan
(
2009
)
Accidents and incidents in semiconductor manufacturing - Learning from the past
Pardon, Alain
(
2009
)
Safe handling of nanomaterial - Risk management in R&D
Pardon, Alain
(
2009
)
Nanotechnologie, veilige technologie ? Naar een nieuw paradigma
Pardon, Alain
(
2009
)
The role of process hazard assessment in semiconductor process development
Pardon, Alain
(
2009
)
Integration of an organic ultra low-k (k=2.2) material
Pantouvaki, Marianna
;
Zhao, Larry
;
Huffman, Craig
;
Heylen, Nancy
;
Ferchichi, Abdelkarim
;
Ono, Y.
;
Nakajima, M.
;
Nakatani, K.
;
Struyf, Herbert
;
Beyer, Gerald
;
Baklanov, Mikhaïl
(
2009
)
Remote electrical detection of surface plasmon polaritons in metal-insulator-metal waveguides
Neutens, Pieter
;
Van Dorpe, Pol
;
De Vlaminck, Iwijn
;
Lagae, Liesbet
;
Borghs, Gustaaf
(
2009
)
Electrical detection of surface plasmon polaritons in metallic slot waveguides
Neutens, Pieter
;
Van Dorpe, Pol
;
De Vlaminck, Iwijn
(
2009
)
Characterization of diamond films grown under continuous DC bias by MW-PECVD – Evidence of ultra-nano-crystalline diamond film growth
Mortet, Vincent
;
Zhang, L.
;
D'Haen, Jan
;
Soltani, A.
;
Douhéret, O.
;
Troadec, D.
;
Van Tendeloo, G.
;
Wagner, Patrick
;
Haenen, Ken
(
2009
)
Control of the grain size and sp2/sp3 ratio in nanocrystalline diamond films using continuous DC bias
Mortet, Vincent
;
Zhang, L.
;
D'Haen, Jan
;
Soltani, A.
;
Douhéret, O.
;
Troadec, D.
;
Van Tendeloo, G.
;
Wagner, Patrick
;
Haenen, Ken
(
2009
)
Study of boron doped epitaxial diamond growth on (110) substrates
Mortet, Vincent
;
Soltani, A.
;
D'Haen, Jan
;
Wagner, Patrick
;
Haenen, Ken
(
2009
)
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