Recently added

RF-MEMS design, multi-physics simulation and reliability analysis

Rottenberg, Xavier (2008)

Measuring the time-of-flight with an optical MEMS-modulator

Roels, Joris; van der Tempel, W.; Van Nieuwenhove, D.; Grootjans, R.; Kuijk, M.; Van Thourhout, Dries; Baets, Roel (2008)

Interrupted back junction solar cells for a high efficient solar cell technology with an aesthetic added value

Robbelein, Jo; Van Kerschaver, Emmanuel; Posthuma, Niels; Beaucarne, Guy; Poortmans, Jef; Mertens, Robert (2008)

Increased exciton diffusion lLength in organic solar cells via sensitized phosphorescence

Rand, Barry (2008)

The design and fabrication of organic photovoltaic cells

Rand, Barry (2008)

Organic solar cells

Rand, Barry (2008)

Exciton management in organic photovoltaic cells

Rand, Barry (2008)

Low power instruction memory and register file plug-ins

Raghavan, Praveen (2008)

Progressive degradation of TiN/SiON and TiN/HfO2 gate stack triple gate SOI nFinFETs subjected to electrical stress

Rafi, Joan Marc; Simoen, Eddy; Mercha, Abdelkarim; Collaert, Nadine; Campabadal, Francesca; Claeys, Cor (2008)

Degradation of high resistivity silicon float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

Rafi, J.M.; Boulord, C.; Hayama, K.; Ohyama, H.; Campabadal, F.; Pellegrini, G.; Lozano, M.; Simoen, Eddy; Claeys, Cor (2008)

Cu plating of through-Si vias for 3D-stacked integrated circuits

Radisic, Alex; Luhn, Ole; Swinnen, Bart; Bender, Hugo; Drijbooms, Chris; Doumen, Geert; Kellens, Kristof; Ruythooren, Wouter; Vereecken, Philippe (2008)

IMEC's view on photovoltaics and the evolution of crystalline Si

Poortmans, Jef (2008)

Comparison of standard macroscopic and Conductive AFM leakage measurements on gate removed high-k capacitors

Polspoel, Wouter; Vandervorst, Wilfried; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier (2008)

New properties of halogen plasma-treated Cu films

Pikulev, Vitaly; Dictus, Dries; Klekachev, Alexander; Baklanov, Mikhaïl (2008)

3D MEMS Metrology @ IMEC: opportunities and problems

Pieters, Philip; De Wolf, Ingrid (2008)

Requirements for cost-effective 3D integration

Pieters, Philip; Beyne, Eric (2008)

Towards the on-chip purification and detection of DNA

Peeters, Sara; Stakenborg, Tim (2008)

Crystallization study of thin ZrO2 ALD films on Al203 and on TiN for DRAM MIMCAP applications

Pawlak, Malgorzata; Menou, Nicolas; Wang, Xin Peng; Dilliway, G.; Pierreux, D.; Fischer, P.; Vos, Rita; Hoyer, R.; Kittl, Jorge; Wouters, Dirk; Biesemans, Serge (2008)

Cryogenic operation of FinFETs for space applications

Pavanello, M.A.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2008)

FinFETs for analog and RF circuits

Parvais, Bertrand; Mercha, Abdelkarim; Wambacq, Piet (2008)

Presentations: Recent submissions

RF-MEMS design, multi-physics simulation and reliability analysis ﻿

Measuring the time-of-flight with an optical MEMS-modulator ﻿

Interrupted back junction solar cells for a high efficient solar cell technology with an aesthetic added value ﻿

Increased exciton diffusion lLength in organic solar cells via sensitized phosphorescence ﻿

The design and fabrication of organic photovoltaic cells ﻿

Organic solar cells ﻿

Exciton management in organic photovoltaic cells ﻿

Low power instruction memory and register file plug-ins ﻿

Progressive degradation of TiN/SiON and TiN/HfO2 gate stack triple gate SOI nFinFETs subjected to electrical stress ﻿

Degradation of high resistivity silicon float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation ﻿

Cu plating of through-Si vias for 3D-stacked integrated circuits ﻿

IMEC's view on photovoltaics and the evolution of crystalline Si ﻿

Comparison of standard macroscopic and Conductive AFM leakage measurements on gate removed high-k capacitors ﻿

New properties of halogen plasma-treated Cu films ﻿

3D MEMS Metrology @ IMEC: opportunities and problems ﻿

Requirements for cost-effective 3D integration ﻿

Towards the on-chip purification and detection of DNA ﻿

Crystallization study of thin ZrO2 ALD films on Al203 and on TiN for DRAM MIMCAP applications ﻿

Cryogenic operation of FinFETs for space applications ﻿

FinFETs for analog and RF circuits ﻿

RF-MEMS design, multi-physics simulation and reliability analysis

Measuring the time-of-flight with an optical MEMS-modulator

Interrupted back junction solar cells for a high efficient solar cell technology with an aesthetic added value

Increased exciton diffusion lLength in organic solar cells via sensitized phosphorescence

The design and fabrication of organic photovoltaic cells

Organic solar cells

Exciton management in organic photovoltaic cells

Low power instruction memory and register file plug-ins

Progressive degradation of TiN/SiON and TiN/HfO2 gate stack triple gate SOI nFinFETs subjected to electrical stress

Degradation of high resistivity silicon float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

Cu plating of through-Si vias for 3D-stacked integrated circuits

IMEC's view on photovoltaics and the evolution of crystalline Si

Comparison of standard macroscopic and Conductive AFM leakage measurements on gate removed high-k capacitors

New properties of halogen plasma-treated Cu films

3D MEMS Metrology @ IMEC: opportunities and problems

Requirements for cost-effective 3D integration

Towards the on-chip purification and detection of DNA

Crystallization study of thin ZrO2 ALD films on Al203 and on TiN for DRAM MIMCAP applications

Cryogenic operation of FinFETs for space applications

FinFETs for analog and RF circuits