Recently added

Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design

Papanikolaou, Antonis (2007)

Electron mobility calculations for Si, Ge and III-V inversion layers with HfO2

O'Regan, Terrance; Fischetti, Massimo; Soree, Bart; Magnus, Wim (2007)

Ni-germanide contacts on Ge: phase formation and electrical characterization

Opsomer, Karl; Simoen, Eddy; Detavernier, C.; Lauwers, Anne; Lavoie, C.; Van Meirhaeghe, R.L.; Maex, Karen (2007)

Cooling of microelectronics using electrostatic actuated liquid droplets

Oprins, Herman; Vandevelde, Bart; Baelmans, Martine (2007)

Extracting thermal parameters from electronic pacakges

Oprins, Herman; Vandevelde, Bart (2007)

Strained Si/SiGe MOS technology

Olsen, S.; Yan, L.; Agaiby, R.; Escobedo-Cousin, E.; O'Neill, A.G.; Hellstrom, P.-E.; Ostling, M.; Lyutovich, L.; Kasper, E.; Claeys, Cor; Parker, E.H.C. (2007)

Radiation damage in proton-irradiated stained Si n-MOSFETs

Ohtani, T.; Hayama, K.; Takakura, K.; Kudou, T.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2007)

Electron energy dependence of defect generation in high-k gate stacks

O'Connor, Robert; Pantisano, Luigi; Degraeve, Robin; Kauerauf, Thomas; Kaczer, Ben; Roussel, Philippe; Groeseneken, Guido (2007)

EUV resist process development for full field imaging

Niroomand, Ardavan; Goethals, Mieke; Van Roey, Frieda; Kim, Byeong Soo; Lorusso, Gian; Pollentier, Ivan; Jonckheere, Rik; Ronse, Kurt (2007)

In-line characterization of heterojunction bipolar transistor base layers by high-resolution x-ray diffraction

Nguyen, Duy; Loo, Roger; Hikavyy, Andriy; Van Daele, Benny; Ryan, Paul; Wormington, Paul; Hopkins, John (2007)

Does NIST database provide reliable effective attenuation lenght for XPS analysis

Nakajima, K.; Kimura, Kenji; Conard, Thierry; Vandervorst, Wilfried (2007)

Fast field-induced magnetization switching in (Ga,Mn)As

Mol, Jan; Li, Zhen; Van Roy, Wim (2007)

Towards extending the capabilities of Scanning Spreading Resistance Microscopy for FinFET-based structures

Mody, Jay; Eyben, Pierre; Augendre, Emmanuel; Richard, Olivier; Arstila, Kai; Vandervorst, Wilfried (2007)

Two-dimendional rhombic-lattice grating coupler for oblique incidence in the integrated crystal waveguide slab

Mizutani, A.; Ikeda, N.; Watanabe, Y.; Ozaki, N.; Takata, Y.; Kitagawa, Y.; Van Laere, Frederik; Taillaert, Dirk; Baets, Roel; Sugimoto, Y.; Asakawas, K. (2007)

Raman spectroscopy on CuTCNQ based cross-point memory structures

Merlen, Alexandre; Valmalette, Jean-Christophe; Chevallier, V.; Turquat, Christian; Muller, Christophe; Muller, Robert; Goux, Ludovic; Wouters, Dirk (2007)

Charge pumping characterization of germanium MOSFETs

Martens, Koen; Kaczer, Ben; De Jaeger, Brice; Meuris, Marc; Maes, Herman; Groeseneken, Guido (2007)

Strained Si-on-insulator for advanced CMOS devices

Mantl, S.; Buca, D.; Zhao, Q.T.; Hollander, B.; Feste, S.; Luysberg, M.; Reiche, M.; Gosele, U.; Buchholtz, W.; Wei, A.; Horstmann, M.; Loo, Roger; Nguyen, Duy (2007)

Integration of a CMOS compatible electrically pumped InP based micro laser

Mandorlo, F.; Rojo Romeo, P.; Seassal, C.; Letartre, X.; Regreny, P.; Fedeli, J.M.; Van Campenhout, Joris; Van Thourhout, Dries (2007)

MPSoC mapping techniques

Mamagkakis, Stylianos (2007)

Microvia-filling by copper electroplating

Luhn, Ole; Van Hoof, Chris; Ruythooren, Wouter; Celis, Jean-Pierre (2007)

Presentations: Recent submissions

Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design ﻿

Electron mobility calculations for Si, Ge and III-V inversion layers with HfO2 ﻿

Ni-germanide contacts on Ge: phase formation and electrical characterization ﻿

Cooling of microelectronics using electrostatic actuated liquid droplets ﻿

Extracting thermal parameters from electronic pacakges ﻿

Strained Si/SiGe MOS technology ﻿

Radiation damage in proton-irradiated stained Si n-MOSFETs ﻿

Electron energy dependence of defect generation in high-k gate stacks ﻿

EUV resist process development for full field imaging ﻿

In-line characterization of heterojunction bipolar transistor base layers by high-resolution x-ray diffraction ﻿

Does NIST database provide reliable effective attenuation lenght for XPS analysis ﻿

Fast field-induced magnetization switching in (Ga,Mn)As ﻿

Towards extending the capabilities of Scanning Spreading Resistance Microscopy for FinFET-based structures ﻿

Two-dimendional rhombic-lattice grating coupler for oblique incidence in the integrated crystal waveguide slab ﻿

Raman spectroscopy on CuTCNQ based cross-point memory structures ﻿

Charge pumping characterization of germanium MOSFETs ﻿

Strained Si-on-insulator for advanced CMOS devices ﻿

Integration of a CMOS compatible electrically pumped InP based micro laser ﻿

MPSoC mapping techniques ﻿

Microvia-filling by copper electroplating ﻿