Recently added

Does a universal memory make sense?

Van Houdt, Jan (2005)

Ervaring met EU LIFE projecten bij IMEC

Van Hoeymissen, Jan (2005)

Internationalization of R&D challenges and orientation for solutions

Van Helleputte, Johan (2005)

Influence of seed layer morphology on the epitaxial growth of polycrystalline-silicon solar cells

Van Gestel, Dries; Gordon, Ivan; Carnel, Lodewijk; Van Nieuwenhuysen, Kris; D'Haen, J.; Irigoyen, J.; Beaucarne, Guy; Poortmans, Jef (2005)

Design of ferromagnetic tunnel contacts for all-electrical spin-injection-detection devices

Van Dorpe, Pol; Vanheertum, Reinier; Boukari, Herve; Van Roy, Wim; Borghs, Gustaaf (2005)

Substrate noise coupling: accurate modeling for deep sub-micron technologies

Van der Plas, Geert (2005)

Draadloze technologieën: status, trends en uitdagingen

Van der Perre, Liesbet; Van Poucke, Bart (2005)

SDRs for wireless terminals flexibility for low power, or not.

Van der Perre, Liesbet; Bougard, Bruno (2005)

Flexible radios: making flexibility rhyme with low cost and low power

Van der Perre, Liesbet (2005)

Evaluation of current java technologies for telecom backend platform design

Van Den Bossche, Bruno; De Turck, Filip; Dhoedt, Bart (2005)

BREAD: An FP6 coordination action in the area of broadband for all

Van Daele, Peter (2005)

Membrane microlasers for the integration of photonic and electronic Ics

Van Campenhout, Joris; Van Thourhout, Dries; Bienstman, Peter; Seassal, C.; Rojo-Romeo, P.; Di Cioccio, L.; Fedeli, J.M. (2005)

Emulation testbed for ORION, overspill routing in optical networks

Van Breusegem, Erik; De Winter, D.; Cheyns, J.; Colle, Didier; Pickavet, Mario; Moreau, J.; Demeester, Piet (2005)

Droplets-free Co2MnSi ferromagnetic thin films grown on GaAs by crossed-beams PLD technique

Valerio, E.; Guinneton, F.; Fabre, A.; Grigorescu, C.; Van Roy, Wim; Autric, M. (2005)

Test structures and methodologies for assessments of back-end-of line (BEOL) reliability

Tokei, Zsolt; Bruynseraede, Christophe (2005)

Surface characterization using TIRF microscopy

Thoelen, R.; Daenen, M.; Williams, O.A.; Vermeeren, V.; Gielen, E.; Hellings, N.; Haenen, Ken; Manca, Jean; Wagner, P.; Ameloot, M.; Michiels, L.; vandeVen, M. (2005)

Engineering ALCVD HfSiO gate stacks for LSTP applications

Swerts, Johan; Deweerd, Wim; De Witte, Hilde; Maes, Jan; Wilk, Glenn; Delabie, Annelies (2005)

High performance organic Schottky diodes

Steudel, Soeren; Lenes, Martijn; Deibel, Carsten; De Vusser, Stijn; Genoe, Jan; Heremans, Paul (2005)

Characterization of extreme ultraviolet resists with interference lithography

Solak, Harun H.; Ekinci, Yasin; Gronheid, Roel; Jouve, Amandine (2005)

TaN metal gate etch with BCl3/O2 plamsa: gate profile and impact on high-k removal process

Shamiryan, Denis; Paraschiv, Vasile; Beckx, Stephan; Boullart, Werner (2005)

Presentations: Recent submissions

Does a universal memory make sense? ﻿

Ervaring met EU LIFE projecten bij IMEC ﻿

Internationalization of R&D challenges and orientation for solutions ﻿

Influence of seed layer morphology on the epitaxial growth of polycrystalline-silicon solar cells ﻿

Design of ferromagnetic tunnel contacts for all-electrical spin-injection-detection devices ﻿

Substrate noise coupling: accurate modeling for deep sub-micron technologies ﻿

Draadloze technologieën: status, trends en uitdagingen ﻿

SDRs for wireless terminals flexibility for low power, or not. ﻿

Flexible radios: making flexibility rhyme with low cost and low power ﻿

Evaluation of current java technologies for telecom backend platform design ﻿

BREAD: An FP6 coordination action in the area of broadband for all ﻿

Membrane microlasers for the integration of photonic and electronic Ics ﻿

Emulation testbed for ORION, overspill routing in optical networks ﻿

Droplets-free Co2MnSi ferromagnetic thin films grown on GaAs by crossed-beams PLD technique ﻿

Test structures and methodologies for assessments of back-end-of line (BEOL) reliability ﻿

Surface characterization using TIRF microscopy ﻿

Engineering ALCVD HfSiO gate stacks for LSTP applications ﻿

High performance organic Schottky diodes ﻿

Characterization of extreme ultraviolet resists with interference lithography ﻿

TaN metal gate etch with BCl3/O2 plamsa: gate profile and impact on high-k removal process ﻿