Recently added

Dependency of the properties of SrxBiyTa2O9 thin films on the SR and BI stoichiometry

Viapiana, Matteo; Wouters, Dirk; Maes, Herman; Van der Biest, Omer (2004)

Systematic functional design of XML tools

Verlinde, H.; Boute, Raymond (2004)

Evaluation of megasonic cleaning for sub-90-nm technologies

Vereecke, Guy; Holsteyns, Frank; Arnauts, Sophia; Kenis, Karine; Lux, Marcel; Vos, Rita; Snow, Jim; Mertens, Paul (2004)

Removal of nano-particles and structural damage in megasonic cleaning of silicon wafers

Vereecke, Guy; Holsteyns, Frank; Arnauts, Sophia; Kenis, Karine; Lux, Marcel; Vos, Rita; Snow, Jim; Mertens, Paul (2004)

Cleaning of nanoparticles in semiconductor manufacturing

Vereecke, Guy; Arnauts, Sophia; Doumen, Geert; Eitoku, Atsuro; Fransaer, J.; Fyen, Wim; Holsteyns, Frank; Kenis, Karine; Lee, Kuntack; Lux, Marcel; Snow, Jim; Vinckier, Chris; Vos, Rita; Xu, Kaidong; Mertens, Paul (2004)

FEOL challenges for particle removal: the case of megasonic cleaning

Vereecke, Guy (2004)

Super secondary grain growth in the barrier/seedlayer system

Vanstreels, Kris; Brongersma, Sywert; Demuynck, Steven; D'Haen, Jan; De Ceuninck, Ward; D'Olieslaeger, Marc; Maex, Karen (2004)

(A)thermal migration of Ge during junction formation in s-Si grown on thin SiGe-buffer layers

Vandervorst, Wilfried; Pawlak, Bartek; Janssens, Tom; Brijs, Bert; Delhougne, Romain; Caymax, Matty; Loo, Roger (2004)

Sub-nanometer resolution dopant profiling in Si and Ge-based nanoscale devices

Vandervorst, Wilfried; Eyben, Pierre; Alvarez, David; Fouchier, Marc (2004)

Surface characterization in microelectronics industry

Vandervorst, Wilfried; Bender, Hugo (2004)

Noise and large-signal characterization of a thin-film MHEMT feedback amplifier in multilayer MCM-D technology

Vandersmissen, Raf; Schreurs, Dominique; Dambrine, G.; Carchon, Geert; Borghs, Gustaaf (2004)

Chromeless phase lithography for contact hole imaging

Vandenberghe, Geert; Hendrickx, Eric; Wiaux, Vincent (2004)

Spin injection into semiconductors through AlOx, Schottky, and Zener tunnel junctions

Van Roy, Wim; Van Dorpe, Pol; Motsnyi, Vasyl; Liu, Zhiyu; De Greve, Kristiaan; Borghs, Gustaaf; De Boeck, Jo (2004)

Spin-LEDs: fundamentals and applications

Van Roy, Wim (2004)

Tunnel contacts for spin injectioninto semiconductors: materials challenges and device aspects

Van Roy, Wim (2004)

Spintronics

Van Roy, Wim (2004)

Spin injection from half-metallic ferromagnets into semiconductors: the case of NiMnSb and (Ga,Mn)As

Van Roy, Wim (2004)

Formally specifying dynamic data structures for embedded software: an initial approach

Van Oudheusden, Karel (2004)

A low-cost poly-sidewall erase HIMOSTM technology for 130-90nm embedded flash memories

Van Houdt, Jan; Haspeslagh, Luc; Wellekens, Dirk; De Vos, Joeri; Hendrickx, Paul; Tsouhlarakis, Jorgo (2004)

Emerging NVM technologies

Van Houdt, Jan (2004)

Presentations: Recent submissions

Dependency of the properties of SrxBiyTa2O9 thin films on the SR and BI stoichiometry ﻿

Systematic functional design of XML tools ﻿

Evaluation of megasonic cleaning for sub-90-nm technologies ﻿

Removal of nano-particles and structural damage in megasonic cleaning of silicon wafers ﻿

Cleaning of nanoparticles in semiconductor manufacturing ﻿

FEOL challenges for particle removal: the case of megasonic cleaning ﻿

Super secondary grain growth in the barrier/seedlayer system ﻿

(A)thermal migration of Ge during junction formation in s-Si grown on thin SiGe-buffer layers ﻿

Sub-nanometer resolution dopant profiling in Si and Ge-based nanoscale devices ﻿

Surface characterization in microelectronics industry ﻿

Noise and large-signal characterization of a thin-film MHEMT feedback amplifier in multilayer MCM-D technology ﻿

Chromeless phase lithography for contact hole imaging ﻿

Spin injection into semiconductors through AlOx, Schottky, and Zener tunnel junctions ﻿

Spin-LEDs: fundamentals and applications ﻿

Tunnel contacts for spin injectioninto semiconductors: materials challenges and device aspects ﻿

Spintronics ﻿

Spin injection from half-metallic ferromagnets into semiconductors: the case of NiMnSb and (Ga,Mn)As ﻿

Formally specifying dynamic data structures for embedded software: an initial approach ﻿

A low-cost poly-sidewall erase HIMOSTM technology for 130-90nm embedded flash memories ﻿

Emerging NVM technologies ﻿

Dependency of the properties of SrxBiyTa2O9 thin films on the SR and BI stoichiometry

Systematic functional design of XML tools

Evaluation of megasonic cleaning for sub-90-nm technologies

Removal of nano-particles and structural damage in megasonic cleaning of silicon wafers

Cleaning of nanoparticles in semiconductor manufacturing

FEOL challenges for particle removal: the case of megasonic cleaning

Super secondary grain growth in the barrier/seedlayer system

(A)thermal migration of Ge during junction formation in s-Si grown on thin SiGe-buffer layers

Sub-nanometer resolution dopant profiling in Si and Ge-based nanoscale devices

Surface characterization in microelectronics industry

Noise and large-signal characterization of a thin-film MHEMT feedback amplifier in multilayer MCM-D technology

Chromeless phase lithography for contact hole imaging

Spin injection into semiconductors through AlOx, Schottky, and Zener tunnel junctions

Spin-LEDs: fundamentals and applications

Tunnel contacts for spin injectioninto semiconductors: materials challenges and device aspects

Spintronics

Spin injection from half-metallic ferromagnets into semiconductors: the case of NiMnSb and (Ga,Mn)As

Formally specifying dynamic data structures for embedded software: an initial approach

A low-cost poly-sidewall erase HIMOSTM technology for 130-90nm embedded flash memories

Emerging NVM technologies