Recently added

Radiation damage in deep submicron MOSFETs by high-temperature electron irradiation

Hayama, K.; Ohyama, H.; Takakura, K.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2002)

UV2Litho: usable vacuum ultra violet lithography

Goethals, Mieke; Jonckheere, Rik; Van Roey, F.; Hermans, J.; Eliat, Astrid; Ronse, Kurt; Wong, P.; Zandbergen, P.; Vasconi, M.; Severgnini, E.; Henke, W.; Hohle, C.; Henry, D.; Thony, P.; Markey, L.; Schiavone, P.; Fuard, D. (2002)

Optimum design of two terminal dual junction monolithic tandem solar cells suffering from interface recombination

Ghannam, Moustafa; Poortmans, Jef; Borghs, Gustaaf; Nijs, Johan; Mertens, Robert (2002)

AlGaN/GaN HEMT: the growth challenge

Germain, Marianne; Leys, Maarten; Boeykens, Steven; Moerman, Ingrid; Borghs, Gustaaf (2002)

Simultaneous AFM and QCM measurements of biological and electrochemical processes

Friedt, Jean-Michel; Choi, Kang-Hoon; Francis, Laurent; Frederix, Filip; Campitelli, Andrew (2002)

Combined atomic force microscope and acoustic wave devices: application to electrodeposition

Friedt, Jean-Michel; Choi, Kang-Hoon; Francis, Laurent; Campitelli, Andrew (2002)

Immunologische interface voor biosensoren gabaseerd op gemengde self-assemblerende monolagen van thiolen

Frederix, Filip (2002)

Progress towards a physical contact model for scanning spreading resistance microscopy

Eyben, Pierre; Denis, Samuel; Clarysse, Trudo; Vandervorst, Wilfried (2002)

Line edge roughness and its increasing importance

Ercken, Monique; Storms, Greet; Delvaux, Christie; Vandenbroeck, Nadia; Leunissen, Peter; Pollentier, Ivan (2002)

Photogeneration efficiency in amorphous materials with long-range potential fluctuations: application to a-Se

Emelianova, E.V.; Arkhipov, Vladimir; Kasap, S.O.; Adriaenssens, G.J. (2002)

Analytical model of a strong-field dark DC conductivity in amorphous semiconductors

Emelianova, E.V.; Arkhipov, Vladimir; Adriaenssens, G.J. (2002)

Mixed-signal compensation techniques for low-cost 802.11a receiver front-ends

Eberle, Wolfgang; Côme, Boris; Donnay, Stephane; Gielen, Georges; De Man, Hugo (2002)

In-line electrical characterization of furnace and plasma and plasma nitrided gate dielectric films

Eason, K.; Passefort, Sophie; Zhang, X.; Cubaynes, Florence; Schaekers, Marc (2002)

Characterization of vertical resurf diodes using scanning probe microsopy

Duhayon, Natasja; Xu, Mingwei; Alvarez, David; Eyben, Pierre; Vandervorst, Wilfried; Hellemans, L.; Rochefort, Christelle; Van Dalen, Rob (2002)

Two-dimensional dopant profiling using scanning probe microscopy

Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Fouchier, Marc; Alvarez, David; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2002)

Two dimensional carrier profiling with scanning capacitance microscopy

Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Fouchier, Marc; Alvarez, David; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2002)

Novel blue emission biphenyl trimer for OLEDs

Ding, X.B.; Zheng, J.G.; Jin, Yadong; Geise, H.J.; Heremans, Paul; Borghs, Gustaaf (2002)

Initial memory complexity analysis of the JVT codec

Denolf, Kristof; Blanch, Carolina (2002)

Efficient FDTD analysis of very large finite photonic crystal structures

Denecker, B.; Olyslager, Frank; Knockaert, Luc; De Zutter, Daniel (2002)

Control plane architectures

Demeester, Piet; Colle, Didier; Qiang, Yan; De Maesschalck, Sophie; Groebbens, Adelbert; Verbrugge, Sofie; Lievens, Ilse; Pickavet, Mario (2002)

Presentations: Recent submissions

Radiation damage in deep submicron MOSFETs by high-temperature electron irradiation ﻿

UV2Litho: usable vacuum ultra violet lithography ﻿

Optimum design of two terminal dual junction monolithic tandem solar cells suffering from interface recombination ﻿

AlGaN/GaN HEMT: the growth challenge ﻿

Simultaneous AFM and QCM measurements of biological and electrochemical processes ﻿

Combined atomic force microscope and acoustic wave devices: application to electrodeposition ﻿

Immunologische interface voor biosensoren gabaseerd op gemengde self-assemblerende monolagen van thiolen ﻿

Progress towards a physical contact model for scanning spreading resistance microscopy ﻿

Line edge roughness and its increasing importance ﻿

Photogeneration efficiency in amorphous materials with long-range potential fluctuations: application to a-Se ﻿

Analytical model of a strong-field dark DC conductivity in amorphous semiconductors ﻿

Mixed-signal compensation techniques for low-cost 802.11a receiver front-ends ﻿

In-line electrical characterization of furnace and plasma and plasma nitrided gate dielectric films ﻿

Characterization of vertical resurf diodes using scanning probe microsopy ﻿

Two-dimensional dopant profiling using scanning probe microscopy ﻿

Two dimensional carrier profiling with scanning capacitance microscopy ﻿

Novel blue emission biphenyl trimer for OLEDs ﻿

Initial memory complexity analysis of the JVT codec ﻿

Efficient FDTD analysis of very large finite photonic crystal structures ﻿

Control plane architectures ﻿