Recently added

Self-organization and complexity in large networked information-processing systems

Cottam, Ronald; Ranson, Willy; Vounckx, Roger (2002)

TOFSIMS investigation of ZrAlO oxide layers

Conard, Thierry; Petry, Jasmine; Richard, Olivier; Vandervorst, Wilfried (2002)

Traffic engineering in data-centric optical networks

Colle, Didier; Qiang, Yan; Puype, Bart; De Maesschalck, Sophie; Lievens, Ilse; Pickavet, Mario; Demeester, Piet (2002)

Design and techno-economical evaluation of multi-layer networks based on ASON/GMPLS

Colle, Didier; De Maesschalck, Sophie; Derkacz, J.; Kantor, M.; Leone, R.; Leszczuk, M.; Lievens, Ilse; Quagliotti, M.; Saluta, F.; Verbrugge, Sofie (2002)

The next-generation Internet and multi-layer network reliability

Colle, Didier (2002)

Characterization of low energy (2-5keV) implantation into Si

Collart, E.J.; Kirkwood, D.; Vandenberg, J.A.; Werner, M.; Vandervorst, Wilfried; Brijs, Bert; Bailey, P.; Noakes, T.C.Q. (2002)

Carrier illumination for monitoring of CMOS ultra-shallow junctions

Clarysse, Trudo; Vandervorst, Wilfried; Lindsay, Richard; Borden, P.; Budiarto, E. (2002)

Impact of advanced processing modules on the low-frequency noise performance of deep submicron CMOS technologies

Claeys, Cor; Simoen, Eddy (2002)

Technology challenges for the microelectronics end-of-the-roadmap triggering global research

Claeys, Cor (2002)

Investigation of protein adsorption with simultaneous measurements of Atomic Force Microscope (AFM) and Quartz Crystal Microbalance (QCM)

Choi, Kang-Hoon; Friedt, Jean-Michel; Frederix, Filip; Laureyn, Wim; Campitelli, Andrew; Borghs, Gustaaf (2002)

Foundations for successful RF chip-package co-design: a packaging perspective

Chandrasekhar, Arun; Beyne, Eric; De Raedt, Walter; Nauwelaers, Bart (2002)

Distributed circuit models for near-CSP interconnects

Chandrasekhar, Arun; Beyne, Eric; De Raedt, Walter; Nauwelaers, Bart (2002)

Multispectral analysis of temporal thermal behavior of anti-personnel mines using principal component and textural transformations

Chan, Jonathan; Sahli, Hichem; Cornelis, Jan (2002)

Growth and characterization of single and mixed metal oxides by ALCVD on various surfaces for high-k gate stack applications

Caymax, Matty; Brijs, Bert; Carter, Richard; Claes, Martine; Conard, Thierry; De Gendt, Stefan; Delabie, Annelies; Heyns, Marc; Richard, Olivier; Vandervorst, Wilfried; Zhao, Chao; Maes, Jan; Chen, Jerry; Cosnier, Vincent; Green, Martin; Kaushik, Vidya; Kluth, Jon; Tsai, Wilman (2002)

Presentations: Recent submissions

Self-organization and complexity in large networked information-processing systems

TOFSIMS investigation of ZrAlO oxide layers

Traffic engineering in data-centric optical networks

Design and techno-economical evaluation of multi-layer networks based on ASON/GMPLS

The next-generation Internet and multi-layer network reliability

Characterization of low energy (2-5keV) implantation into Si

Carrier illumination for monitoring of CMOS ultra-shallow junctions

Impact of advanced processing modules on the low-frequency noise performance of deep submicron CMOS technologies

Technology challenges for the microelectronics end-of-the-roadmap triggering global research

Investigation of protein adsorption with simultaneous measurements of Atomic Force Microscope (AFM) and Quartz Crystal Microbalance (QCM)

Foundations for successful RF chip-package co-design: a packaging perspective

Distributed circuit models for near-CSP interconnects

Multispectral analysis of temporal thermal behavior of anti-personnel mines using principal component and textural transformations

Growth and characterization of single and mixed metal oxides by ALCVD on various surfaces for high-k gate stack applications

Charge trapping, mobility degradation and reliability of high-e gate stacks

An active electrode for mixed measurement techniques, with application to EIT

Nanoindentation on low-k dielectrics

Nanoindentation on low-k dielectrics

Ion beam analysis: the past, the present and the future

From ULSI to microsystems and nanotechnology

Presentations: Recent submissions

Self-organization and complexity in large networked information-processing systems ﻿

TOFSIMS investigation of ZrAlO oxide layers ﻿

Traffic engineering in data-centric optical networks ﻿

Design and techno-economical evaluation of multi-layer networks based on ASON/GMPLS ﻿

The next-generation Internet and multi-layer network reliability ﻿

Characterization of low energy (2-5keV) implantation into Si ﻿

Carrier illumination for monitoring of CMOS ultra-shallow junctions ﻿

Impact of advanced processing modules on the low-frequency noise performance of deep submicron CMOS technologies ﻿

Technology challenges for the microelectronics end-of-the-roadmap triggering global research ﻿

Investigation of protein adsorption with simultaneous measurements of Atomic Force Microscope (AFM) and Quartz Crystal Microbalance (QCM) ﻿

Foundations for successful RF chip-package co-design: a packaging perspective ﻿

Distributed circuit models for near-CSP interconnects ﻿

Multispectral analysis of temporal thermal behavior of anti-personnel mines using principal component and textural transformations ﻿

Growth and characterization of single and mixed metal oxides by ALCVD on various surfaces for high-k gate stack applications ﻿

Charge trapping, mobility degradation and reliability of high-e gate stacks ﻿

An active electrode for mixed measurement techniques, with application to EIT ﻿

Nanoindentation on low-k dielectrics ﻿

Nanoindentation on low-k dielectrics ﻿

Ion beam analysis: the past, the present and the future ﻿

From ULSI to microsystems and nanotechnology ﻿

Self-organization and complexity in large networked information-processing systems

TOFSIMS investigation of ZrAlO oxide layers

Traffic engineering in data-centric optical networks

Design and techno-economical evaluation of multi-layer networks based on ASON/GMPLS

The next-generation Internet and multi-layer network reliability

Characterization of low energy (2-5keV) implantation into Si

Carrier illumination for monitoring of CMOS ultra-shallow junctions

Impact of advanced processing modules on the low-frequency noise performance of deep submicron CMOS technologies

Technology challenges for the microelectronics end-of-the-roadmap triggering global research

Investigation of protein adsorption with simultaneous measurements of Atomic Force Microscope (AFM) and Quartz Crystal Microbalance (QCM)

Foundations for successful RF chip-package co-design: a packaging perspective

Distributed circuit models for near-CSP interconnects

Multispectral analysis of temporal thermal behavior of anti-personnel mines using principal component and textural transformations

Growth and characterization of single and mixed metal oxides by ALCVD on various surfaces for high-k gate stack applications

Charge trapping, mobility degradation and reliability of high-e gate stacks

An active electrode for mixed measurement techniques, with application to EIT

Nanoindentation on low-k dielectrics

Nanoindentation on low-k dielectrics

Ion beam analysis: the past, the present and the future

From ULSI to microsystems and nanotechnology