Recently added

On the influence of optical feedback on the wavelength switching behaviour of tunable lasers

Moeyersoon, Bart; Morthier, Geert; Baets, Roel (2001)

Crystallization and tetragonal-monoclinic transformation in ZrO2 and HfO2 dielectric thin films

Zhao, Chao; Roebben, G.; Heyns, Marc; Van der Biest, O. (2001)

Stabilization of amorphous structures in ALCVD high-k oxide layers

Zhao, Chao; Richard, Olivier; Bender, Hugo; Young, Edward; Carter, Richard; Tsai, Wilman; Caymax, Matty; De Gendt, Stefan; Heyns, Marc; Roebben, G.; Van der Biest, O.; Maes, Jos; Tuominen, Marko; Haukka, S. (2001)

Crystallization behaviour of ZrO2/Al2O3-based high-k gate stacks

Zhao, Chao; Richard, Olivier; Bender, Hugo; Houssa, Michel; Carter, Richard; De Gendt, Stefan; Heyns, Marc; Young, Edward; Tsai, Wilman; Roebben, G.; Van der Biest, O.; Haukka, S. (2001)

Properties of electron traps generated in the gate oxide

Zhang, Wenqi; Zhang, Jenny; Lalor, M.; Burton, D.; Groeseneken, Guido; Degraeve, Robin (2001)

The role of hydrogen in hole trap generation in oxides and oxynitrides

Zhang, Wenqi; Sii, H. K.; Chen, A. H.; Zhao, Chao; Uren, M. J.; Groeseneken, Guido; Degraeve, Robin (2001)

Optimization of cleaning processes for 100 nm and smaller design rules

Xu, Kaidong; Vos, Rita; Holsteyns, Frank; Kenis, Karine; Vereecke, Guy; Mertens, Paul; Heyns, Marc (2001)

Power flow fluctuations in distribution grids with high PV penetration

Woyte, Achim; Belmans, Ronnie; Nijs, Johan (2001)

Copper CMP using a Lam teres linear planarization technology

Vos, I.; Meuris, Marc; Sijmus, Bram; Stella, Mario; Delaney, N.; Gobbin, Korneel (2001)

A perspective on dry laser cleaning for semiconductor manufacturing

Vereecke, Guy; Röhr, Erika; Van Hoeymissen, Jan; Mertens, Paul; Heyns, Marc (2001)

Determination of degradation products in O3/DI processes

Vankerckhoven, Hans; De Smedt, Frank; Van Herp, Bart; Claes, M.; De Gendt, Stefan; Heyns, Marc; Vinckier, Chris (2001)

(Un)solvable problems in SIMS

Vandervorst, Wilfried; Janssens, Tom; De Witte, Hilde; Conard, Thierry; Lindsay, Richard; Fruehauf, Jens; Loo, Roger; Caymax, Matty (2001)

Nanometer scale carrier profiling with scanning probes

Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Hantschel, Thomas; Xu, Mingwei; Clarysse, Trudo (2001)

Nm-scale characterization of deep submicron devices using scanning probes

Vandervorst, Wilfried; Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Clarysse, Trudo (2001)

Thin (2-4nm) medium and high-k dielectrica: a challenge for physical metrology

Vandervorst, Wilfried (2001)

Counting atoms on the nm-scale

Vandervorst, Wilfried (2001)

Metamorphic GaAs ICs and metamorphic HEMT technology on germanium

Vandersmissen, Raf; Schreurs, Dominique; van der Zanden, Koen; Borghs, Gustaaf (2001)

Accelerated ageing tests on metamorphic HEMTs on germanium

Vandersmissen, Raf; Petersen, Rainer; Schreurs, Dominique; Mijlemans, P.; Borghs, Gustaaf (2001)

Performance optimisation of the double exposure alternatin PSM for sub-100 nm ICs

Vandenberghe, Geert; Driessen, Frank; Van Adrichem, Paul; Ronse, Kurt (2001)

Sources for spin injection into semiconductors: half-metallic NiMnSb and others

Van Roy, Wim; Motsnyi, Vasyl; Liu, Zhiyu; Wojcik, Marek; Jedryka, Ewa; Nadolski, S.; Safarov, V. I.; Borghs, Gustaaf; De Boeck, Jo (2001)

Presentations: Recent submissions

On the influence of optical feedback on the wavelength switching behaviour of tunable lasers ﻿

Crystallization and tetragonal-monoclinic transformation in ZrO2 and HfO2 dielectric thin films ﻿

Stabilization of amorphous structures in ALCVD high-k oxide layers ﻿

Crystallization behaviour of ZrO2/Al2O3-based high-k gate stacks ﻿

Properties of electron traps generated in the gate oxide ﻿

The role of hydrogen in hole trap generation in oxides and oxynitrides ﻿

Optimization of cleaning processes for 100 nm and smaller design rules ﻿

Power flow fluctuations in distribution grids with high PV penetration ﻿

Copper CMP using a Lam teres linear planarization technology ﻿

A perspective on dry laser cleaning for semiconductor manufacturing ﻿

Determination of degradation products in O3/DI processes ﻿

(Un)solvable problems in SIMS ﻿

Nanometer scale carrier profiling with scanning probes ﻿

Nm-scale characterization of deep submicron devices using scanning probes ﻿

Thin (2-4nm) medium and high-k dielectrica: a challenge for physical metrology ﻿

Counting atoms on the nm-scale ﻿

Metamorphic GaAs ICs and metamorphic HEMT technology on germanium ﻿

Accelerated ageing tests on metamorphic HEMTs on germanium ﻿

Performance optimisation of the double exposure alternatin PSM for sub-100 nm ICs ﻿

Sources for spin injection into semiconductors: half-metallic NiMnSb and others ﻿